Effect of x-ray birefringence on radial distribution functions for amorphous materials

1989 ◽  
Vol 40 (10) ◽  
pp. 6505-6508 ◽  
Author(s):  
David H. Templeton ◽  
Lieselotte K. Templeton
Keyword(s):  
Radial Distribution ◽  
Amorphous Materials ◽  
Distribution Functions ◽  
Radial Distribution Functions ◽  
X Ray

Structural Study of a Decagonal Al75Fe15Ni10 Alloy by Anomalous X-ray Scattering (AXS) Method

1991 ◽  
Vol 46 (7) ◽  
pp. 605-608 ◽  
Author(s):  
E. Matsubara ◽  
Y. Waseda ◽  
A. P. Tsai ◽  
A. Inoue ◽  
T. Masumoto
Keyword(s):  
Structural Study ◽  
Radial Distribution ◽  
Distribution Functions ◽  
Radial Distribution Functions ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A structural study of an as-quenched decagonal Al75Fe15Ni10 alloy has been carried out by anomalous x-ray scattering (AXS) as well as ordinary x-ray diffraction. The environmental radial distribution functions (RDFs) for Fe and Ni determined by the AXS measurements turned out to resemble each other and to be similar to the ordinary RDF obtained by ordinary x-ray diffraction. These results clearly show that the Ni and Fe atoms are homogeneously distributed and occupy the same sites in the decagonal structure of Al75Fe15Ni10.

What can x-ray scattering tell us about the radial distribution functions of water?

2000 ◽  
Vol 113 (20) ◽  
pp. 9149-9161 ◽  
Author(s):  
Jon M. Sorenson ◽  
Greg Hura ◽  
Robert M. Glaeser ◽  
Teresa Head-Gordon
Keyword(s):  
Radial Distribution ◽  
Distribution Functions ◽  
Radial Distribution Functions ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Energy-Filtered Electron Diffraction from Silica Thin Films

1992 ◽  
Vol 284 ◽  
Author(s):  
L. C. Qin ◽  
L. W. Hobbs
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Radial Distribution ◽  
Amorphous Materials ◽  
Scanning Transmission Electron Microscope ◽  
Distribution Functions ◽  
Radial Distribution Functions ◽  
Intensity Data ◽  
Scattered Electron ◽  
Silica Thin Films

ABSTRACTEnergy filtering has been applied to electron diffraction patterns to obtain electron scattering intensity data of single energy collected using a scanning transmission electron microscope. For amorphous materials, the technique permits reconstruction of radial distribution functions from elastically scattered electron intensity data; amorphous silica thin films have been analyzed in the present experiments. The radial distribution functions are characterized in terms of interatomic distances and are compared to neutron scattering results in the form of total correlation functions.

Model Calculation for the Fe80B20 Alloy Glass

1982 ◽  
Vol 37 (6) ◽  
pp. 611-612 ◽  
Author(s):  
T. Fujiwara ◽  
H. S. Chen ◽  
Y. Waseda
Keyword(s):  
Neutron Diffraction ◽  
Model Calculation ◽  
Radial Distribution ◽  
Short Distance ◽  
Random Packing ◽  
Distribution Functions ◽  
Radial Distribution Functions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Model Structures

Abstract Three partial radial distribution functions [RDF’s] are calculated by means of relaxed dense-random packing models for a Fe80B20 glass. The model structures reproduce fairly well recently reported experimental partial RDF's derived from x-ray diffraction and neutron diffraction using isotopic substitutional methods. Most significantly, both the model calculated by means of relaxed dense-random packing models GBB (r), the appearance of a subpeak on the short distance side of the first peak.

Radial distribution functions from diffracted electron intensities

1989 ◽  
Vol 47 ◽  
pp. 502-503
Author(s):  
J. Bentley ◽  
P. Angelini ◽  
P. S. Sklad ◽  
A. T. Fisher
Keyword(s):  
Electron Diffraction ◽  
Radial Distribution ◽  
Amorphous Materials ◽  
Dynamic Range ◽  
Diffraction Method ◽  
Distribution Functions ◽  
Amorphous Semiconductors ◽  
Radial Distribution Functions ◽  
Hydrogenated Silicon ◽  
Electron Microscopes

Many previous studies have shown the benefits of electronically recorded intensity profiles of electron diffraction patterns obtained with a transmission electron microscope (TEM). The technique, which is based on the scanning diffraction method developed by Grigson et al., avoids the complex procedures involved in making densitometer traces from film, greatly expands the dynamic range, and allows energy filtering to remove inelastically scattered electrons that have lost more than a few eV. Early applications to amorphous materials employed TEMs fitted with scanning systems and electrostatic filters below the projector lens. The main emphasis of the work of Graczyk et al. was on structural models for amorphous semiconductors such as silicon and germanium. However, a treatment for binary materials was developed and measurements were made for SiO2 and Ge-Te alloys. Cockayne et al. have recently extended these early techniques to modern 100 and 300 kV analytical electron microscopes, which when equipped with energy loss spectrometers and energy-dispersive x-ray analysis systems, do not require further major modification. Applications for which radial distribution functions have been determined from online measurements of energy-filtered selected area electron diffraction pattern intensity profiles have included amorphous thin films of carbon (a-C), germanium (a-Ge), boron nitride (a-BN), hydrogenated silicon (a-Si:H), silicon-carbon (a-Si1-xCx:H), and phosphorus- and boron-doped hydrogenated silicon.

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