Soft-x-ray emission and inelastic electron-scattering study of the electronic excitations in amorphous and crystalline silicon dioxide

1988 ◽  
Vol 38 (8) ◽  
pp. 5547-5553 ◽  
Author(s):  
V. Jeyasingh Nithianandam ◽  
S. E. Schnatterly
Keyword(s):  
Silicon Dioxide ◽  
Electron Scattering ◽  
Crystalline Silicon ◽  
Inelastic Electron ◽  
Electronic Excitations ◽  
X Ray ◽  
Inelastic Electron Scattering ◽  
Scattering Study

Electron-scattering study of low-lying levels in 63,65Cu

1988 ◽  
Vol 66 (2) ◽  
pp. 182-186 ◽  
Author(s):  
C. Rangacharyulu ◽  
E. J. Ansaldo
Keyword(s):  
Excitation Energy ◽  
Electron Scattering ◽  
Weak Coupling ◽  
Form Factors ◽  
Coupling Model ◽  
Inelastic Electron ◽  
Inelastic Electron Scattering ◽  
Wide Range ◽  
Model Predictions ◽  
Scattering Study

Inelastic electron–scattering form factors have been measured for 63,65Cu levels below 4 MeV excitation energy for momentum transfers q < 1.2 fm−1. The data obtained, along with the results from previous work, were used to test the validity of simple weak-coupling model predictions. It was found that while the weak-coupling model is only partially successful in describing the properties of the low-lying levels in those nuclei, the properties of the 65Cu levels are well described as two valence neutrons coupled to 63Cu levels over a wide range of momentum transfers.

Extended Core Edge Fine Structure in the E.M.

1980 ◽  
Vol 38 ◽  
pp. 120-121
Author(s):  
R.D. Leapman
Keyword(s):  
Fine Structure ◽  
Electron Scattering ◽  
Inelastic Electron ◽  
High Resolution Imaging ◽  
X Ray ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Core Electrons ◽  
Resolution Imaging ◽  
X Ray Absorption

Extended X-ray Absorption Fine Structure (EXAFS) analysis makes use of synchrotron radiaion to measure modulations in the absorption coefficient above core edges and hence to obtain information about local atomic environments. EXAFS arises when ejected core electrons are backscattered by surrounding atoms and interfere with the outgoing waves. Recently, interest has also been shown in using inelastic electron scattering1-4. Some advantages of Extended X-ray-edge Energy Loss Fine Structure (EXELFS) are: a) small probes formed by the analytical electron microscope give spectra from μm to nm sized areas, compared with mm diameter areas for the X-ray technique, b) EXELFS can be combined with other techniques such as electron diffraction or high resolution imaging, and c) EXELFS is sensitive to low Z elements with K edges from ˜200 eV to ˜ 3000 eV (B to Cl).

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