Auger-electron-spectroscopy analysis of a plasmon loss in palladium silicide formed from Pd deposits on silicon

1987 ◽  
Vol 36 (14) ◽  
pp. 7422-7427 ◽  
Author(s):  
R. Anton ◽  
U. Neukirch ◽  
M. Harsdorff
Keyword(s):  
Auger Electron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Spectroscopy Analysis ◽  
Auger Electron Spectroscopy Analysis ◽  
Plasmon Loss ◽  
Palladium Silicide

Auger electron spectroscopy analysis of oxidation states of Te in amorphous CdTe oxide thin films

1997 ◽  
Vol 15 (5) ◽  
pp. 2537-2541 ◽  
Author(s):  
A. Zapata-Navarro ◽  
P. Bartolo-Pérez ◽  
M. Zapata-Torres ◽  
R. Castro-Rodriguez ◽  
J. L. Peña ◽  
...  
Keyword(s):  
Thin Films ◽  
Auger Electron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Oxidation States ◽  
Oxide Thin Films ◽  
Spectroscopy Analysis ◽  
Auger Electron Spectroscopy Analysis
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