CaF2/Si(111): Thin-film characterization by high-resolution electron-energy-loss spectroscopy

1986 ◽  
Vol 34 (10) ◽  
pp. 7471-7474 ◽  
Author(s):  
M. Liehr ◽  
P. A. Thiry ◽  
J. J. Pireaux ◽  
R. Caudano
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