Metal-silicon interfaces and multiple scattering in their low-energy electron diffractions

1986 ◽  
Vol 33 (2) ◽  
pp. 919-924 ◽  
Author(s):  
W. S. Yang ◽  
S. C. Wu ◽  
R. G. Zhao
Keyword(s):  
Multiple Scattering ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron

Advanced Multiple Scattering Theories of Low-Energy Electron Diffraction (LEED)

1991 ◽  
Vol 253 ◽  
Author(s):  
M.A. Van Hove
Keyword(s):  
Electron Diffraction ◽  
Multiple Scattering ◽  
Complex Surface ◽  
Low Energy ◽  
Energy Electron ◽  
Surface Structures ◽  
Large Unit ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron ◽  
Large Unit Cell

ABSTRACTRecent advances in the theory of low-energy electron diffraction (LEED) are reviewed. They primarily concern methods to handle the multiple scattering of electrons in an atomiclattice. These advances have allowed the structure determination by LEED of complex surface structures, including large-unit-cell overlayers of molecules, disordered and incommensurate overlayers, complex reconstructions and adsorbate-induced relaxations.

Low Energy Electron Diffraction Analysis of Ultrathin Ag Films on W(110)

1998 ◽  
Vol 05 (06) ◽  
pp. 1143-1149 ◽  
Author(s):  
H. C. Poon ◽  
S. Y. Tong ◽  
W. F. Chung ◽  
M. S. Altman
Keyword(s):  
Electron Diffraction ◽  
Multiple Scattering ◽  
Low Energy ◽  
Energy Electron ◽  
Electron Diffraction Data ◽  
Surface Barrier ◽  
Layer Spacing ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron ◽  
Ag Film

We have measured low energy electron diffraction data for clean W(110), ultrathin and thick Ag films on W(110). The data are analyzed by full dynamical multiple scattering calculations to determine the structure of the Ag-film/W(110) system. The multiple scattering calculation takes into account the incommensurate scattering between the non-pseudomorphic Ag films and the W(110) substrate. We have examined the effect of dynamical inputs used in the calculation. We find that for normally incident electrons, the surface barrier at the vacuum-film interface and the inelastic damping modify mainly relative intensities of the diffraction peaks while the energy-dependent inner potential at low energies influences peak positions. After the dynamical inputs are independently determined, we use the data below 25 eV where the electron's mean free path is long, to determine the layer spacing at the Ag film – W substrate interface. A major trend we find is that the layer spacing at the interface decreases as the Ag film's thickness increases.

Tomographic reconstruction of multiple in-line holograms for multiple scattering in low energy electron holography

2001 ◽  
Vol 79 (1) ◽  
pp. 37-48 ◽  
Author(s):  
M R.A. Shegelski ◽  
M B Whitwick ◽  
R Holenstein ◽  
T A Rothwell
Keyword(s):  
Point Source ◽  
Multiple Scattering ◽  
Tomographic Reconstruction ◽  
Three Dimensional ◽  
Low Energy ◽  
Energy Electron ◽  
Electron Holography ◽  
Atomic Cluster ◽  
Low Energy Electron ◽  
Object Relative

We generate simulated holograms for low energy electron point source (LEEPS) microscopy. For a given object (atomic cluster) we construct a number of different holograms by varying the position or the orientation of the object relative to the screen. We then compare the three-dimensional structures of the reconstructions obtained from these holograms using methods developed and reported in previous works. In this investigation, we focus on clusters for which multiple scattering must be taken into account. We report results for bcc-type clusters, a spiral configuration, and some random arrangements. We find that the methods employed give vastly improved reconstructions even when multiple scattering is important. PACS No.: 61.14Nm

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