Multiple-scattering theory of low-energy electron diffraction for a nonspherical scattering potential

1985 ◽  
Vol 32 (10) ◽  
pp. 6562-6570 ◽  
Author(s):  
Seido Nagano ◽  
S. Y. Tong
Keyword(s):  
Electron Diffraction ◽  
Multiple Scattering ◽  
Scattering Theory ◽  
Low Energy ◽  
Energy Electron ◽  
Multiple Scattering Theory ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron ◽  
Scattering Potential

Advanced Multiple Scattering Theories of Low-Energy Electron Diffraction (LEED)

1991 ◽  
Vol 253 ◽  
Author(s):  
M.A. Van Hove
Keyword(s):  
Electron Diffraction ◽  
Multiple Scattering ◽  
Complex Surface ◽  
Low Energy ◽  
Energy Electron ◽  
Surface Structures ◽  
Large Unit ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron ◽  
Large Unit Cell

ABSTRACTRecent advances in the theory of low-energy electron diffraction (LEED) are reviewed. They primarily concern methods to handle the multiple scattering of electrons in an atomiclattice. These advances have allowed the structure determination by LEED of complex surface structures, including large-unit-cell overlayers of molecules, disordered and incommensurate overlayers, complex reconstructions and adsorbate-induced relaxations.

Low Energy Electron Diffraction Analysis of Ultrathin Ag Films on W(110)

1998 ◽  
Vol 05 (06) ◽  
pp. 1143-1149 ◽  
Author(s):  
H. C. Poon ◽  
S. Y. Tong ◽  
W. F. Chung ◽  
M. S. Altman
Keyword(s):  
Electron Diffraction ◽  
Multiple Scattering ◽  
Low Energy ◽  
Energy Electron ◽  
Electron Diffraction Data ◽  
Surface Barrier ◽  
Layer Spacing ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron ◽  
Ag Film

We have measured low energy electron diffraction data for clean W(110), ultrathin and thick Ag films on W(110). The data are analyzed by full dynamical multiple scattering calculations to determine the structure of the Ag-film/W(110) system. The multiple scattering calculation takes into account the incommensurate scattering between the non-pseudomorphic Ag films and the W(110) substrate. We have examined the effect of dynamical inputs used in the calculation. We find that for normally incident electrons, the surface barrier at the vacuum-film interface and the inelastic damping modify mainly relative intensities of the diffraction peaks while the energy-dependent inner potential at low energies influences peak positions. After the dynamical inputs are independently determined, we use the data below 25 eV where the electron's mean free path is long, to determine the layer spacing at the Ag film – W substrate interface. A major trend we find is that the layer spacing at the interface decreases as the Ag film's thickness increases.

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