scholarly journals Structural relaxation of amorphousPd82Si18: X-ray measurements, electrical-resistivity measurements, and a comparison using the Ziman theory

1985 ◽  
Vol 32 (6) ◽  
pp. 3399-3408 ◽  
Author(s):  
E. Chason ◽  
A. L. Greer ◽  
K. F. Kelton ◽  
P. S. Pershan ◽  
L. B. Sorensen ◽  
...  
Keyword(s):  
Electrical Resistivity ◽  
Structural Relaxation ◽  
X Ray ◽  
Resistivity Measurements ◽  
Ziman Theory

STUDY OF THE DEPENDENCE OF HIGH Tc ON VARIOUS SINTERING TEMPERATURES FOR Bi-Pb-Sr-Ca-Cu-O SUPERCONDUCTORS

1991 ◽  
Vol 05 (24n25) ◽  
pp. 1635-1638
Author(s):  
S.M. M.R. NAQVI ◽  
A.A. QIDWAI ◽  
S.M. ZIA-UL-HAQUE ◽  
FIROZ AHMAD ◽  
S.D.H. RIZVI ◽  
...  
Keyword(s):  
Electrical Resistivity ◽  
Liquid Nitrogen ◽  
X Ray Diffraction ◽  
High Tc ◽  
X Ray ◽  
Resistivity Measurements ◽  
Zero Resistance

Bi1.7-Pb0.3-Sr2-Ca2-Cu3-Ox superconducting samples were prepared at 855°C, 862 C, 870 C, and 882 C sintering temperatures respectively. All samples were sintered for 120 hours. The samples were then quenched in liquid nitrogen. The electrical resistivity measurements showed that the samples sintered at 870° C had the best Tc. For these samples the Tc onset was around 120 K and the zero resistance was obtained at 108 K. X-ray diffraction studies showed that the samples were multiphased.

Evolution of crystal structure of dual layered molecular conductor (ET)4ZnBr4(C6H4Cl2) with temperature

CrystEngComm ◽  
2021 ◽  
Author(s):  
Gennady V. Shilov ◽  
Elena I. Zhilyaeva ◽  
Sergey M. Aldoshin ◽  
Alexandra M Flakina ◽  
Rustem B. Lyubovskii ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Electrical Resistivity ◽  
Single Crystal ◽  
Room Temperature ◽  
Organic Conductor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Resistivity Measurements ◽  
Molecular Conductor ◽  
Abrupt Changes

Electrical resistivity measurements of a dual layered organic conductor (ET)4ZnBr4(1,2-C6H4Cl2) above room temperature show abrupt changes in resistivity at 320 K. Single-crystal X-ray diffraction studies in the 100-350 K range...

MEASUREMENTS OF STRUCTURAL RELAXATION IN AMORPHOUS Pd82 Si18: X-RAY DIFFRACTION AND ELECTRICAL RESISTIVITY

1985 ◽  
pp. 683-686 ◽  
Author(s):  
E. Chason ◽  
K.F. Kelton ◽  
P.S. Pershan ◽  
F. Spaepen ◽  
A.H. Weiss ◽  
...  
Keyword(s):  
Electrical Resistivity ◽  
Structural Relaxation ◽  
X Ray Diffraction ◽  
X Ray

Phase Transformations of TIMETAL-18 as a New Titanium Alloy with Bimodal Microstructure

2014 ◽  
Vol 922 ◽  
pp. 418-423 ◽  
Author(s):  
E. Lebrun ◽  
P. Svec ◽  
S. Nowak ◽  
B. Denand ◽  
Y. Millet ◽  
...  
Keyword(s):  
Electrical Resistivity ◽  
Phase Transformations ◽  
Weight Percent ◽  
Alpha Phase ◽  
Nominal Composition ◽  
Bimodal Microstructure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Resistivity Measurements ◽  
Beta Alloy

In this work, we have investigated the microstructural evolutions and the phase transformations of a new near-beta alloy with a nominal composition of Ti-5.5Al-5V-5Mo-2.4Cr-0.75Fe-0.15O (weight percent), the TIMETAL 18 [here after called Ti-18]. The complete microstructural state of the Ti-18 during heat treatments, from as quenched metastable state, has been first investigated. The phase transformations have been studied by combination of X-ray diffraction analysis, metallurgical observations and electrical resistivity measurements. From a series of isothermal treatments, the first complete TTT diagram has been then established displaying three C-curves corresponding to different precipitation domains for alpha phase.

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