X-ray anomalous scattering and specular reflection inMVphotoabsorption regions

1984 ◽  
Vol 29 (12) ◽  
pp. 6576-6585 ◽  
Author(s):  
J. M. André ◽  
R. Barchewitz ◽  
A. Maquet ◽  
R. Marmoret
Keyword(s):  
Specular Reflection ◽  
Anomalous Scattering ◽  
X Ray

Ellipsometric and X-ray specular reflection studies on naturally grown overlayers on aluminium thin films

1984 ◽  
Vol 120 (4) ◽  
pp. 249-256 ◽  
Author(s):  
P.B. Barna ◽  
Z. Bodó ◽  
G. Gergely ◽  
P. Croce ◽  
J. Ádám ◽  
...  
Keyword(s):  
Thin Films ◽  
Specular Reflection ◽  
X Ray

CHOOCH: a program for deriving anomalous-scattering factors from X-ray fluorescence spectra

2001 ◽  
Vol 34 (1) ◽  
pp. 82-86 ◽  
Author(s):  
Gwyndaf Evans ◽  
Robert F. Pettifer
Keyword(s):  
Absorption Edge ◽  
Fluorescence Spectra ◽  
Heavy Atom ◽  
Fortran Program ◽  
Anomalous Scattering ◽  
Tabular Data ◽  
X Ray ◽  
Scattering Factor ◽  
Experimental Values ◽  
Kronig Relation

A Fortran programCHOOCH, which derives experimental values of the anomalous-scattering factorsf′′ andf′ from X-ray fluorescence spectra, is described. The program assumes knowledge of theoretical values for the imaginary term,f′′, of the anomalous-scattering factor away from the absorption edge to scale the experimental fluorescence spectrum and thus derive values off′′ near the absorption edge, where tabular data are inappropriate. The Kramers–Kronig relation is used to calculate the real part,f′, of the anomalous-scattering factor. The program aids the decision-making process in macromolecular crystallographic experiments where optimal wavelength selection is required. Magnitudes off′ andf′′ at selected wavelengths can later be used as starting values for heavy-atom refinement with crystallographic phasing programs.

Soft X-ray refractive index by reconciling total electron yield with specular reflection: experimental determination of the optical constants of graphite

2018 ◽  
Vol 25 (5) ◽  
pp. 1433-1443
Author(s):  
C. Jansing ◽  
H. Wahab ◽  
H. Timmers ◽  
A. Gaupp ◽  
H.-C. Mertins
Keyword(s):  
Refractive Index ◽  
Optical Constants ◽  
Specular Reflection ◽  
Complex Refractive Index ◽  
Reflection Spectra ◽  
Total Electron Yield ◽  
Total Electron ◽  
X Ray ◽  
Electron Yield ◽  
Saturation Effects

The complex refractive index of many materials is poorly known in the soft X-ray range across absorption edges. This is due to saturation effects that occur there in total-electron-yield and fluorescence-yield spectroscopy and that are strongest at resonance energies. Aiming to obtain reliable optical constants, a procedure that reconciles electron-yield measurements and reflection spectroscopy by correcting these saturation effects is presented. The procedure takes into account the energy- and polarization-dependence of the photon penetration depth as well as the creation efficiency for secondary electrons and their escape length. From corrected electron-yield spectra the absorption constants and the imaginary parts of the refractive index of the material are determined. The real parts of the index are subsequently obtained through a Kramers–Kronig transformation. These preliminary optical constants are refined by simulating reflection spectra and adapting them, so that measured reflection spectra are reproduced best. The efficacy of the new procedure is demonstrated for graphite. The optical constants that have been determined for linearly polarized synchrotron light incident with p- and s-geometry provide a detailed and reliable representation of the complex refractive index of the material near π- and σ-resonances. They are also suitable for allotropes of graphite such as graphene.

Structures of Co90Fe10/Cu multilayers determined by X-ray anomalous scattering measurements

2006 ◽  
Vol 496 (2) ◽  
pp. 571-575 ◽  
Author(s):  
Y.K. An ◽  
B. Dai ◽  
Z.H. Mai ◽  
J.W. Cai ◽  
Z.H. Wu
Keyword(s):  
Anomalous Scattering ◽  
X Ray ◽  
Scattering Measurements

An instrument for time-resolved and anomalous simultaneous small- and wide-angle X-ray scattering (SWAXS) at NSRRC

2006 ◽  
Vol 39 (6) ◽  
pp. 871-877 ◽  
Author(s):  
Ying-Huang Lai ◽  
Ya-Sen Sun ◽  
U-Ser Jeng ◽  
Jhih-Min Lin ◽  
Tsang-Lang Lin ◽  
...  
Keyword(s):  
Lipid Membrane ◽  
Quantum Wires ◽  
Grazing Incidence ◽  
Anomalous Scattering ◽  
Wide Angle ◽  
Scanning Calorimetry ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A SWAXS (small- and wide-angle X-ray scattering) instrument was recently installed at the wiggler beamline BL17B3 of the National Synchrotron Radiation Research Center (NSRRC), Taiwan. The instrument, which is designed for studies of static and dynamic nanostructures and correlations between the nano (ormeso) structure (SAXS) and crystalline structure (WAXS), provides a flux of 1010–1011photon s−1at the sample at energies between 5 and 14 keV. With a SAXS area detector and a WAXS linear detector connected to two data acquisition systems operated in master–slave mode, the instrument allows one to perform time-resolved as well as anomalous scattering measurements. Data reduction algorithms have been developed for rapid processing of the large SWAXS data sets collected during time-resolved measurements. The performance of the instrument is illustrated by examples taken from different classes of ongoing projects: (i) time-resolved SAXS/WAXS/differential scanning calorimetry (DSC) with a time resolution of 10 s on a semicrystalline poly(hexamethylene terephthalate) sample, (ii) anomalous SAXS/WAXS measurements on a nanoparticulate PtRu catalyst, and (iii) grazing-incidence SAXS of a monolayer of oriented semiconductor quantum wires, and humidity-controlled ordering of Alamethicin peptides embedded in an oriented lipid membrane.

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