Core-level reflectance spectroscopy of black phosphorus single crystals

1983 ◽  
Vol 28 (2) ◽  
pp. 1165-1167 ◽  
Author(s):  
M. Taniguchi ◽  
M. Seki ◽  
S. Suga ◽  
A. Mikuni ◽  
H. Kanzaki ◽  
...  
1983 ◽  
Vol 45 (2) ◽  
pp. 59-61 ◽  
Author(s):  
M. Taniguchi ◽  
S. Suga ◽  
M. Seki ◽  
H. Sakamoto ◽  
H. Kanzaki ◽  
...  

2018 ◽  
Vol 57 (7) ◽  
pp. 4098-4103 ◽  
Author(s):  
Ziming Zhang ◽  
Muhammad Khurram ◽  
Zhaojian Sun ◽  
Qingfeng Yan

2008 ◽  
Vol 181 (8) ◽  
pp. 1707-1711 ◽  
Author(s):  
Tom Nilges ◽  
Marcel Kersting ◽  
Thorben Pfeifer

1989 ◽  
Vol 28 (Part 1, No. 6) ◽  
pp. 1019-1022 ◽  
Author(s):  
Mamoru Baba ◽  
Fukunori Izumida ◽  
Yuji Takeda ◽  
Akira Morita

1991 ◽  
Vol 30 (Part 1, No. 8) ◽  
pp. 1753-1758 ◽  
Author(s):  
Mamoru Baba ◽  
Fukunori Izumida ◽  
Akira Morita ◽  
Yoji Koike ◽  
Tetsuro Fukase

2013 ◽  
Vol 1576 ◽  
Author(s):  
Tony D. Kelly ◽  
James C. Petrosky ◽  
John W. McClory ◽  
Timothy Zens ◽  
David Turner ◽  
...  

ABSTRACTThe electronic properties of ThO2 single crystals were studied using x-ray photoemission spectroscopy (XPS). The XPS results show that the Th 4f core level is in an oxidation state that is consistent with that expected for Th in ThO2. The effective Debye temperature is estimated from the temperature dependent photoemission intensities of the Th 4f core level over the temperature range of 290 to 360 K. A Debye temperature of 468±32 K has been determined.


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