Symmetry analysis and uniaxial-stress effect on the low-field electroreflectance of Si from 3.0 to 4.0 eV
Keyword(s):
1987 ◽
pp. 1585-1592
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Keyword(s):
1982 ◽
Vol 51
(5)
◽
pp. 1345-1346
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1982 ◽
Vol 51
(10)
◽
pp. 3245-3249
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Keyword(s):
1978 ◽
Vol 44
(5)
◽
pp. 1562-1566
◽
1991 ◽
Vol 60
(2)
◽
pp. 384-386
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