Deviations from linear temperature dependence of the electrical resistivity of V-Cr and Ta-W alloys

1976 ◽  
Vol 13 (4) ◽  
pp. 1507-1514 ◽  
Author(s):  
J. C. H. Chiu
Keyword(s):  
Electrical Resistivity ◽  
Temperature Dependence ◽  
Linear Temperature Dependence ◽  
Linear Temperature

scholarly journals Structural and thermoelectric properties of TMGa3 (TM = Fe, Co) thin films

2013 ◽  
Vol 4 ◽  
pp. 461-466 ◽  
Author(s):  
Sebastian Schnurr ◽  
Ulf Wiedwald ◽  
Paul Ziemann ◽  
Valeriy Y Verchenko ◽  
Andrei V Shevelkov
Keyword(s):  
Thin Films ◽  
Electrical Resistivity ◽  
Temperature Dependence ◽  
Metallic Glasses ◽  
Bulk Material ◽  
Amorphous Film ◽  
High Resistivity ◽  
Linear Temperature Dependence ◽  
Flash Evaporation ◽  
Linear Temperature

Based on chemically synthesized powders of FeGa3, CoGa3, as well as of a Fe0.75Co0.25Ga3 solid solution, thin films (typical thickness 40 nm) were fabricated by flash evaporation onto various substrates held at ambient temperature. In this way, the chemical composition of the powders could be transferred one-to-one to the films as demonstrated by Rutherford backscattering experiments. The relatively low deposition temperature necessary for conserving the composition leads, however, to ‘X-ray amorphous’ film structures with immediate consequences on their transport properties: A practically temperature-independent electrical resistivity of ρ = 200 μΩ·cm for CoGa3 and an electrical resistivity of about 600 μΩ·cm with a small negative temperature dependence for FeGa3. The observed values and temperature dependencies are typical of high-resistivity metallic glasses. This is especially surprising in the case of FeGa3, which as crystalline bulk material exhibits a semiconducting behavior, though with a small gap of 0.3 eV. Also the thermoelectric performance complies with that of metallic glasses: Small negative Seebeck coefficients of the order of −6 μV/K at 300 K with almost linear temperature dependence in the range 10 K ≤ T ≤ 300 K.

Magnetic Susceptibility and Electrical Resistivity of Dilute Chromium–Titanium Alloys

1971 ◽  
Vol 49 (23) ◽  
pp. 3010-3023 ◽  
Author(s):  
C. H. Chiu ◽  
M. H. Jericho ◽  
R. H. March
Keyword(s):  
Electrical Resistivity ◽  
Magnetic Susceptibility ◽  
Temperature Dependence ◽  
Titanium Alloys ◽  
Electron Scattering ◽  
Linear Temperature Dependence ◽  
Linear Temperature ◽  
Dilute Alloys ◽  
Extra Electron ◽  
Pure Chromium

We report measurements of the magnetic susceptibility and the electrical resistivity of chromium–titanium alloys containing Ti concentrations of up to 0.6 at.%. The measurements were performed between 320 and 4.2 K. A very rapid depression of both the Néel temperature and the spin-flip temperature on alloying was observed. The paramagnetic susceptibility of pure chromium and the alloys displayed a linear temperature dependence and it is suggested that thermal expansion effects might be responsible for this linear temperature dependence. The analysis of the electrical resistivity results points to the existence of an extra electron scattering mechanism above TN in pure chromium as well as the dilute alloys.

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