scholarly journals Floquet engineering of low-energy dispersions and dynamical localization in a periodically kicked three-band system

2021 ◽  
Vol 104 (17) ◽  
Author(s):  
Lakpa Tamang ◽  
Tanay Nag ◽  
Tutul Biswas
Keyword(s):  
Band System ◽  
Low Energy ◽  
Dynamical Localization

HgCl B2Σ+1/2 formation by low-energy electron impact dissociation of HgCl2 and(or) CH3HgCl molecules: applications to HgCl (B → X) laser

1990 ◽  
Vol 68 (2) ◽  
pp. 166-169 ◽  
Author(s):  
Mohammad F. Mahmood
Keyword(s):  
Energy Range ◽  
Electron Energy ◽  
Cross Sections ◽  
Band System ◽  
Low Energy ◽  
Dissociative Excitation ◽  
Intense Band ◽  
Electron Impact Dissociation ◽  
Low Energy Electrons ◽  
Low Energy Electron

An investigation was made of the process of dissociative excitation of a HgCl radical in the B2Σ+1/2 state due to collisions of low-energy electrons with HgCl2 and CH3HgCl molecules. Using the most intense band of the B2Σ+1/2 – X2Σ+1/2 system of the HgCl radical at 557 nm that corresponds to the ν′ = 0 to ν″ = 22 transition, emission cross sections were measured in the electron energy range 1–100 eV. The threshold electron energy for the observation of the B2Σ+1/2 – X2Σ+1/2 band system has been determined to be 7.0 and 8.0 eV for HgCl2 and CH3HgCl molecules, respectively.

scholarly journals Multiparticle Localization at Low Energy for Multidimensional Continuous Anderson Models

2020 ◽  
Vol 2020 ◽  
pp. 1-15
Author(s):  
Trésor Ekanga
Keyword(s):  
Probability Distribution ◽  
Anderson Model ◽  
Multiscale Analysis ◽  
Random Potential ◽  
Particle Interaction ◽  
Low Energy ◽  
Dynamical Localization ◽  
Hölder Continuous ◽  
The Continuum ◽  
Number Of Particles

We study the multiparticle Anderson model in the continuum and show that under some mild assumptions on the random external potential and the inter-particle interaction, for any finite number of particles, the multiparticle lower spectral edges are almost surely constant in absence of ergodicity. We stress that this result is not quite obvious and has to be handled carefully. In addition, we prove the spectral exponential and the strong dynamical localization of the continuous multiparticle Anderson model at low energy. The proof based on the multiparticle multiscale analysis bounds needs the values of the external random potential to be independent and identically distributed, whose common probability distribution is at least Log-Hölder continuous.

Localization in the multi-particle tight-binding Anderson model at low energy

2019 ◽  
Vol 32 (03) ◽  
pp. 2050009
Author(s):  
Trésor Ekanga
Keyword(s):  
Anderson Model ◽  
Particle Interaction ◽  
Tight Binding ◽  
Low Energy ◽  
Dynamical Localization ◽  
Scale Analysis ◽  
Hölder Continuous ◽  
Multi Scale ◽  
Spectral Edge ◽  
Marginal Probability Distribution

We consider the multi-particle tight-binding Anderson model and prove that its lower spectral edge is non-random under some mild assumptions on the inter-particle interaction and the random external potential. We also adapt to the low energy regime the multi-particle multi-scale analysis initially developed by Chulaevsky and Suhov in the high disorder limit, if the marginal probability distribution of the i.i.d. random variables is log-Hölder continuous and we obtain the spectral exponential and strong dynamical localization near the bottom of the spectrum.

Dynamical localization of a two-band system in real-space

2005 ◽  
Vol 347 (4-6) ◽  
pp. 255-261 ◽  
Author(s):  
Xian-Ke Peng ◽  
Jian-Li Shao ◽  
Suqing Duan ◽  
Xian-Geng Zhao
Keyword(s):  
Band System ◽  
Real Space ◽  
Dynamical Localization

Dissociated Σ=27 boundaries in silicon

1988 ◽  
Vol 46 ◽  
pp. 624-625
Author(s):  
A. Garg ◽  
W.A.T. Clark ◽  
J.P. Hirth
Keyword(s):  
Electron Diffraction ◽  
Local Minimum ◽  
Boundary Energy ◽  
Coincidence Site Lattice ◽  
Boundary Plane ◽  
Low Energy ◽  
Theoretical Understanding ◽  
Site Lattice ◽  
Kikuchi Pattern ◽  
Analysis Techniques

In the last twenty years, a significant amount of work has been done in the theoretical understanding of grain boundaries. The various proposed grain boundary models suggest the existence of coincidence site lattice (CSL) boundaries at specific misorientations where a periodic structure representing a local minimum of energy exists between the two crystals. In general, the boundary energy depends not only upon the density of CSL sites but also upon the boundary plane, so that different facets of the same boundary have different energy. Here we describe TEM observations of the dissociation of a Σ=27 boundary in silicon in order to reduce its surface energy and attain a low energy configuration.The boundary was identified as near CSL Σ=27 {255} having a misorientation of (38.7±0.2)°/[011] by standard Kikuchi pattern, electron diffraction and trace analysis techniques. Although the boundary appeared planar, in the TEM it was found to be dissociated in some regions into a Σ=3 {111} and a Σ=9 {122} boundary, as shown in Fig. 1.

Transfer optics for high spatial resolution electron spectroscopy

1988 ◽  
Vol 46 ◽  
pp. 666-667
Author(s):  
G. G. Hembree ◽  
Luo Chuan Hong ◽  
P.A. Bennett ◽  
J.A. Venables
Keyword(s):  
Magnetic Field ◽  
Scanning Transmission Electron Microscope ◽  
Low Energy ◽  
Objective Lens ◽  
State University ◽  
Arizona State University ◽  
Initial Field ◽  
Resolution Electron ◽  
Scanning Transmission ◽  
Low Energy Electrons

A new field emission scanning transmission electron microscope has been constructed for the NSF HREM facility at Arizona State University. The microscope is to be used for studies of surfaces, and incorporates several surface-related features, including provision for analysis of secondary and Auger electrons; these electrons are collected through the objective lens from either side of the sample, using the parallelizing action of the magnetic field. This collimates all the low energy electrons, which spiral in the high magnetic field. Given an initial field Bi∼1T, and a final (parallelizing) field Bf∼0.01T, all electrons emerge into a cone of semi-angle θf≤6°. The main practical problem in the way of using this well collimated beam of low energy (0-2keV) electrons is that it is travelling along the path of the (100keV) probing electron beam. To collect and analyze them, they must be deflected off the beam path with minimal effect on the probe position.

Performance Evaluation of a Novel Type of Low-Energy Electron Microscope

1990 ◽  
Vol 48 (1) ◽  
pp. 354-355
Author(s):  
Bertholdand Senftinger ◽  
Helmut Liebl
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Field Strength ◽  
Numerical Aperture ◽  
Low Energy ◽  
Energy Electron ◽  
High Resolution Imaging ◽  
Lens System ◽  
Resolution Imaging ◽  
Low Energy Electron

During the last few years the investigation of clean and adsorbate-covered solid surfaces as well as thin-film growth and molecular dynamics have given rise to a constant demand for high-resolution imaging microscopy with reflected and diffracted low energy electrons as well as photo-electrons. A recent successful implementation of a UHV low-energy electron microscope by Bauer and Telieps encouraged us to construct such a low energy electron microscope (LEEM) for high-resolution imaging incorporating several novel design features, which is described more detailed elsewhere.The constraint of high field strength at the surface required to keep the aberrations caused by the accelerating field small and high UV photon intensity to get an improved signal-to-noise ratio for photoemission led to the design of a tetrode emission lens system capable of also focusing the UV light at the surface through an integrated Schwarzschild-type objective. Fig. 1 shows an axial section of the emission lens in the LEEM with sample (28) and part of the sample holder (29). The integrated mirror objective (50a, 50b) is used for visual in situ microscopic observation of the sample as well as for UV illumination. The electron optical components and the sample with accelerating field followed by an einzel lens form a tetrode system. In order to keep the field strength high, the sample is separated from the first element of the einzel lens by only 1.6 mm. With a numerical aperture of 0.5 for the Schwarzschild objective the orifice in the first element of the einzel lens has to be about 3.0 mm in diameter. Considering the much smaller distance to the sample one can expect intense distortions of the accelerating field in front of the sample. Because the achievable lateral resolution depends mainly on the quality of the first imaging step, careful investigation of the aberrations caused by the emission lens system had to be done in order to avoid sacrificing high lateral resolution for larger numerical aperture.

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