scholarly journals Phonon transport in disordered alloys: A Multiple-scattering approach

2021 ◽  
Vol 104 (10) ◽  
Author(s):  
Aftab Alam
Keyword(s):  
Multiple Scattering ◽  
Phonon Transport ◽  
Disordered Alloys

First Principles Calculation of Residual Resistivity

1991 ◽  
Vol 253 ◽  
Author(s):  
D. M. Nicholson ◽  
R. H. Brown ◽  
W. H. Butler ◽  
H. Yang ◽  
J. W. Swihart ◽  
...  
Keyword(s):  
Multiple Scattering ◽  
First Principles ◽  
Density Functional ◽  
Local Density ◽  
Mean Free Path ◽  
Residual Resistivity ◽  
First Principles Calculation ◽  
Functional Theory ◽  
Disordered Alloys ◽  
Random Alloys

ABSTRACTThe list of physical properties which are important in the design of materials and which are routinely calculated from first principles within the local density approximation to density functional theory is continually growing. In this paper we discuss the application of multiple scattering theory to the calculation of the residual resistivity of disordered alloys. Progress has been made on two fronts. First, the coherent potential approximation for the resistivity, which sums to all orders a limited set of multiple scattering diagrams, has given resistivities in agreement with experiment for alloys where the site occupation is roughly random. Second, the linearized KKR was used to evaluate the Kubo formula for several large configurations of atoms and obtain the resistivity with all multiple scattering paths included. This method is not limited to random alloys, but can be applied to short range ordered and amorphous alloys provided the resistivity is high enough to limit the mean free path to a single unit cell.

Analysis of STEM micrographs of thick objects

1978 ◽  
Vol 36 (2) ◽  
pp. 106-107
Author(s):  
S. Golladay
Keyword(s):  
Inelastic Scattering ◽  
Multiple Scattering ◽  
Mass Distribution ◽  
Cross Sections ◽  
Phase Contrast ◽  
Image Point ◽  
Contrast Effects ◽  
Total Cross Sections ◽  
Elastic And Inelastic Scattering

The theory of multiple scattering has been worked out by Groves and comparisons have been made between predicted and observed signals for thick specimens observed in a STEM under conditions where phase contrast effects are unimportant. Independent measurements of the collection efficiencies of the two STEM detectors, calculations of the ratio σe/σi = R, where σe, σi are the total cross sections for elastic and inelastic scattering respectively, and a model of the unknown mass distribution are needed for these comparisons. In this paper an extension of this work will be described which allows the determination of the required efficiencies, R, and the unknown mass distribution from the data without additional measurements or models. Essential to the analysis is the fact that in a STEM two or more signal measurements can be made simultaneously at each image point.

Background Fitting in the Low-Loss Region of Electron Energy Loss Spectra

1990 ◽  
Vol 48 (2) ◽  
pp. 56-57
Author(s):  
C P Scott ◽  
A J Craven ◽  
C J Gilmore ◽  
A W Bowen
Keyword(s):  
Energy Loss ◽  
Multiple Scattering ◽  
Simple Form ◽  
Single Scattering ◽  
Low Loss ◽  
Characteristic Energy ◽  
Normal Method ◽  
Fitting In ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

The normal method of background subtraction in quantitative EELS analysis involves fitting an expression of the form I=AE-r to an energy window preceding the edge of interest; E is energy loss, A and r are fitting parameters. The calculated fit is then extrapolated under the edge, allowing the required signal to be extracted. In the case where the characteristic energy loss is small (E < 100eV), the background does not approximate to this simple form. One cause of this is multiple scattering. Even if the effects of multiple scattering are removed by deconvolution, it is not clear that the background from the recovered single scattering distribution follows this simple form, and, in any case, deconvolution can introduce artefacts.The above difficulties are particularly severe in the case of Al-Li alloys, where the Li K edge at ~52eV overlaps the Al L2,3 edge at ~72eV, and sharp plasmon peaks occur at intervals of ~15eV in the low loss region. An alternative background fitting technique, based on the work of Zanchi et al, has been tested on spectra taken from pure Al films, with a view to extending the analysis to Al-Li alloys.

Hierarchical structures lead to high thermoelectric performance in Cum+nPb100SbmTe100Se2m (CLAST)

2021 ◽  
Author(s):  
Siqi Wang ◽  
Yu Xiao ◽  
Yongjin Chen ◽  
Shang Peng ◽  
Dongyang Wang ◽  
...  
Keyword(s):  
Hierarchical Structures ◽  
Phonon Transport ◽  
Thermoelectric Performance

Hierarchical microstructures lead to high thermoelectric performance in Cum+nPb100SbmTe100Se2m (CLAST) through synergistically optimizing carrier and phonon transport.

MULTIPLE SCATTERING EFFECTS IN THE COBALT K-EDGE EXAFS OF METAL CARBONYL COMPLEXES

1986 ◽  
Vol 47 (C8) ◽  
pp. C8-589-C8-592
Author(s):  
N. BINSTED ◽  
S. L. COOK ◽  
J. EVANS ◽  
R. J. PRICE ◽  
G. N. GREAVES
Keyword(s):  
Multiple Scattering ◽  
Metal Carbonyl ◽  
Carbonyl Complexes ◽  
Metal Carbonyl Complexes ◽  
Scattering Effects ◽  
Multiple Scattering Effects

Multiparametric crystallography using the diversity of multiple scattering patterns for Bragg and diffuse waves. Method of standing diffuse waves

2011 ◽  
Vol 181 (7) ◽  
pp. 681 ◽  
Author(s):  
V.B. Molodkin ◽  
A.P. Shpak ◽  
M.V. Kovalchuk ◽  
V.F. Machulin ◽  
V.L. Nosik
Keyword(s):  
Multiple Scattering
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