Tuning the magnetic state in a phase-separated magnetic oxide thin film by means of electric field and temperature

2020 ◽  
Vol 101 (17) ◽  
Author(s):  
O. G. Udalov ◽  
I. S. Beloborodov
2012 ◽  
Author(s):  
Ritha Soulimane ◽  
Anne-Marie Haghiri ◽  
Wilfrid Prellier ◽  
Gilles Poullain ◽  
Rachid Bouregba ◽  
...  

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Heesoo Lee ◽  
Ki Soo Chang ◽  
Young Jun Tak ◽  
Tae Soo Jung ◽  
Jeong Woo Park ◽  
...  

Materials ◽  
2018 ◽  
Vol 11 (11) ◽  
pp. 2103 ◽  
Author(s):  
Hyeonju Lee ◽  
Xue Zhang ◽  
Jung Kim ◽  
Eui-Jik Kim ◽  
Jaehoon Park

Metal-oxide thin-film transistors (TFTs) have been developed as promising candidates for use in various electronic and optoelectronic applications. In this study, we fabricated bilayer zinc oxide (ZnO)/indium oxide (In2O3) TFTs by using the sol-gel solution process, and investigated the structural and chemical properties of the bilayer ZnO/In2O3 semiconductor and the electrical properties of these transistors. The thermogravimetric analysis results showed that ZnO and In2O3 films can be produced by the thermal annealing process at 350 °C. The grazing incidence X-ray diffraction patterns and X-ray photoemission spectroscopy results revealed that the intensity and position of characteristic peaks related to In2O3 in the bilayer structure were not affected by the underlying ZnO film. On the other hand, the electrical properties, such as drain current, threshold voltage, and field-effect mobility of the bilayer ZnO/In2O3 TFTs obviously improved, compared with those of the single-layer In2O3 TFTs. Considering the energy bands of ZnO and In2O3, the enhancement in the TFT performance is explained through the electron transport between ZnO and In2O3 and the formation of an internal electric field in the bilayer structure. In the negative gate-bias stress experiments, it was found that the internal electric field contributes to the electrical stability of the bilayer ZnO/In2O3 TFT by reducing the negative gate-bias-induced field and suppressing the trapping of holes in the TFT channel. Consequently, we suggest that the bilayer structure of solution-processed metal-oxide semiconductors is a viable means of enhancing the TFT performance.


2013 ◽  
Vol 64 (3) ◽  
Author(s):  
Mas Elyza Mohd Azol ◽  
Nafarizal Nayan ◽  
Uda Hashim ◽  
Muhammad Kashif ◽  
Mahnaz Shafiei ◽  
...  

This paper reports on the study of the effect on adding total peripheries and sharp edges to the Schottky contact as a hydrogen sensor. Schottky contact was successfully designed and fabricated as hexagon-shape. The contact was integrated together with zinc oxide thin film and tested towards 1% hydrogen gas. Simulations of the design were conducted using COMSOL Multiphysics to observe the electric field characteristic at the contact layer. The simulation results show higher electric field induced at sharp edges with 4.18×104 V/m. Current-voltage characteristic shows 0.27 V voltage shift at 40 µA biased current.


2010 ◽  
Vol 97 (18) ◽  
pp. 182105 ◽  
Author(s):  
Hirotaka Koide ◽  
Yuki Nagao ◽  
Kunihito Koumoto ◽  
Yuka Takasaki ◽  
Tomonari Umemura ◽  
...  

2015 ◽  
Vol 135 (6) ◽  
pp. 192-198 ◽  
Author(s):  
Shinnosuke Iwamatsu ◽  
Yutaka Abe ◽  
Toru Yahagi ◽  
Seiya Kobayashi ◽  
Kazushige Takechi ◽  
...  

2020 ◽  
Vol 59 (12) ◽  
pp. 125001
Author(s):  
Nan Ye ◽  
Satoka Ohnishi ◽  
Mitsuhiro Okada ◽  
Kazuto Hatakeyama ◽  
Kazuhiko Seki ◽  
...  

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