Skewness and critical current behavior in a graphene Josephson junction

2020 ◽  
Vol 101 (6) ◽  
Author(s):  
Diego A. Manjarrés ◽  
Shirley Gómez Páez ◽  
William J. Herrera
Keyword(s):  
Josephson Junction ◽  
Critical Current ◽  
Current Behavior

Experimental Research on Critical Current Behavior of Various Commercial HTS Tapes

2020 ◽  
Vol 30 (4) ◽  
pp. 1-6
Author(s):  
Li Ren ◽  
Shuqiang Guo ◽  
Guilun Chen ◽  
Lushun Su ◽  
Ying Xu ◽  
...  
Keyword(s):  
Critical Current ◽  
Experimental Research ◽  
Current Behavior

Critical Current Behavior in Fiber Spun YBCO Superconducting Rods

1993 ◽  
pp. 597-600
Author(s):  
R. E. Powers ◽  
Y. Z. Negm ◽  
M. Z. Tahar ◽  
G. O. Zimmerman
Keyword(s):  
Critical Current ◽  
Current Behavior

scholarly journals Pinned fluxons in a Josephson junction with a finite-length inhomogeneity

2011 ◽  
Vol 23 (2) ◽  
pp. 201-244 ◽  
Author(s):  
GIANNE DERKS ◽  
ARJEN DOELMAN ◽  
CHRISTOPHER J. K. KNIGHT ◽  
HADI SUSANTO
Keyword(s):  
Josephson Junction ◽  
Critical Current ◽  
Finite Length ◽  
Liouville Theory ◽  
Piecewise Constant Function ◽  
Josephson Tunneling ◽  
Piecewise Constant ◽  
Different Types ◽  
Sturm Liouville ◽  
The Stability

We consider a Josephson junction system installed with a finite length inhomogeneity, either of micro-resistor or micro-resonator type. The system can be modelled by a sine-Gordon equation with a piecewise-constant function to represent the varying Josephson tunneling critical current. The existence of pinned fluxons depends on the length of the inhomogeneity, the variation in the Josephson tunneling critical current and the applied bias current. We establish that a system may either not be able to sustain a pinned fluxon, or – for instance by varying the length of the inhomogeneity – may exhibit various different types of pinned fluxons. Our stability analysis shows that changes of stability can only occur at critical points of the length of the inhomogeneity as a function of the (Hamiltonian) energy density inside the inhomogeneity – a relation we determine explicitly. In combination with continuation arguments and Sturm–Liouville theory, we determine the stability of all constructed pinned fluxons. It follows that if a given system is able to sustain at least one pinned fluxon, a microresistor has exactly one pinned fluxon, i.e. the system selects one unique pinned stable pinned configuration, and a microresonator has at least one stable pinned configuration. Moreover, it is shown that both for micro-resistors and micro-resonators this stable pinned configuration may be non-monotonic – something which is not possible in the homogeneous case. Finally, it is shown that results in the literature on localised inhomogeneities can be recovered as limits of our results on micro-resonators.

scholarly journals Critical current behavior of Ag-coated YBa/sub 2/Cu/sub 3/O/sub 7-x/ thin films

1991 ◽  
Vol 27 (2) ◽  
pp. 1471-1474 ◽  
Author(s):  
R.H. Ono ◽  
J.A. Beall ◽  
T.E. Harvey ◽  
C.D. Reintsema ◽  
M. Johansson ◽  
...  
Keyword(s):  
Thin Films ◽  
Critical Current ◽  
Current Behavior

scholarly journals Pb/InAs Nanowire Josephson Junction with High Critical Current and Magnetic Flux Focusing

Nano Letters ◽  
2015 ◽  
Vol 15 (3) ◽  
pp. 1803-1808 ◽  
Author(s):  
J. Paajaste ◽  
M. Amado ◽  
S. Roddaro ◽  
F. S. Bergeret ◽  
D. Ercolani ◽  
...  
Keyword(s):  
Magnetic Flux ◽  
Josephson Junction ◽  
Critical Current

THE RESPONSIBILITY OF HIGH Tc SUPERCONDUCTOR DETECTOR

1988 ◽  
Vol 01 (11n12) ◽  
pp. 431-435 ◽  
Author(s):  
CHANGXIN FAN ◽  
LIANGKAI YU
Keyword(s):  
Electromagnetic Radiation ◽  
Josephson Junction ◽  
Critical Current ◽  
Radiation Power ◽  
Radiation Detector ◽  
Dynamic Resistance ◽  
High Tc ◽  
High Tc Superconductor ◽  
Detector Experiment ◽  
Current Device

The V-I characteristics of Y-Ba-Cu-O device is different from that of conventional low Tc Josephson junction. This enables us to use the small critical current device as an electromagnetic radiation detector. Experiment shows that the smaller the critical current is, the greater the dynamic resistance and the higher the voltage responsibility to radiation power. When the critical current is adjusted down to zero but the V-I curve is still obviously nonlinear, the device will have highest responsibility.

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