Extended X-ray Absorption Fine Structure (EXAFS) analysis makes use of
synchrotron radiaion to measure modulations in the absorption coefficient
above core edges and hence to obtain information about local atomic
environments. EXAFS arises when ejected core electrons are backscattered by
surrounding atoms and interfere with the outgoing waves. Recently, interest
has also been shown in using inelastic electron
scattering1-4. Some advantages of Extended
X-ray-edge Energy Loss Fine Structure (EXELFS) are: a) small probes formed
by the analytical electron microscope give spectra from μm to nm sized
areas, compared with mm diameter areas for the X-ray technique, b) EXELFS
can be combined with other techniques such as electron diffraction or high
resolution imaging, and c) EXELFS is sensitive to low Z elements with K
edges from ˜200 eV to ˜ 3000 eV (B to Cl).
Movement of Fe with respect to the heme plane in the R-T transition of carp hemoglobin. An extended x-ray absorption fine structure study.