Noise of hot carriers in single-injection solid-state diodes with traps lying below the Fermi level

1974 ◽  
Vol 10 (8) ◽  
pp. 3273-3279 ◽  
Author(s):  
Y. K. Sharma
1978 ◽  
pp. 110-114 ◽  
Author(s):  
J. P. Nougier ◽  
D. Gasquet ◽  
J. C. Vaissiere ◽  
H. R. Bilger

2019 ◽  
Vol 21 (43) ◽  
pp. 24070-24076 ◽  
Author(s):  
Sheng-Hai Zhu ◽  
Bao-Luo Yan ◽  
Wei Zeng ◽  
Dai-He Fan ◽  
Bin Tang ◽  
...  

Based on the reverse shifts of the DOS curves near the Fermi level, we propose a new criterion for solid-state phase transition named Conch Criterion, which has been verified in the TMD system.


2006 ◽  
Author(s):  
Brian C. O'Regan ◽  
Chris Shuttle ◽  
Samantha Handa ◽  
Sara Koops ◽  
James R. Durrant

Author(s):  
А.С. Рудый ◽  
А.А. Мироненко ◽  
В.В. Наумов ◽  
А.М. Скундин ◽  
Т.Л. Кулова ◽  
...  

The design description and test results of an all solid-state thin-film lithium-ion battery are provided. It is shown that the features of its charge-discharge characteristics are associated with a change in the Fermi level of the electrodes and are caused by a change in the concentration of lithium ions in the course of the charge-discharge. The specific capacitive characteristics of the layout are determined, which are comparable with the characteristics of industrial solid-state lithium-ion batteries.


Physica B+C ◽  
1978 ◽  
Vol 94 (2) ◽  
pp. 141-151 ◽  
Author(s):  
T.G.M. Kleinpenning
Keyword(s):  

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