Identification of Semiconductor Defects through Constant-Fermi-Level
Ab Initio
Molecular Dynamics: Application to GaAs
Keyword(s):
1992 ◽
Vol 83-87
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pp. 433-446
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Keyword(s):
2017 ◽
Vol 13
(4)
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pp. 1769-1777
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2019 ◽