Magnetization Response of the Bulk and Supplementary Magnetic Domain Structure in High-Permeability Steel Laminations VisualizedIn Situby Neutron Dark-Field Imaging

2016 ◽  
Vol 6 (2) ◽  
Author(s):  
B. Betz ◽  
P. Rauscher ◽  
R. P. Harti ◽  
R. Schäfer ◽  
A. Irastorza-Landa ◽  
...  
2008 ◽  
Vol 93 (11) ◽  
pp. 112504 ◽  
Author(s):  
C. Grünzweig ◽  
C. David ◽  
O. Bunk ◽  
M. Dierolf ◽  
G. Frei ◽  
...  

2016 ◽  
Vol 6 (2) ◽  
Author(s):  
B. Betz ◽  
P. Rauscher ◽  
R. P. Harti ◽  
R. Schäfer ◽  
H. Van Swygenhoven ◽  
...  

2020 ◽  
Vol 259 ◽  
pp. 126816 ◽  
Author(s):  
I. Dhiman ◽  
R. Ziesche ◽  
L. Riik ◽  
I. Manke ◽  
A. Hilger ◽  
...  

Author(s):  
M. Awaji

It is necessary to improve the resolution, brightness and signal-to-noise ratio(s/n) for the detection and identification of point defects in crystals. In order to observe point defects, multi-beam dark-field imaging is one of the useful methods. Though this method can improve resolution and brightness compared with dark-field imaging by diffuse scattering, the problem of s/n still exists. In order to improve the exposure time due to the low intensity of the dark-field image and the low resolution, we discuss in this paper the bright-field high-resolution image and the corresponding subtracted image with reference to a changing noise level, and examine the possibility for in-situ observation, identification and detection of the movement of a point defect produced in the early stage of damage process by high energy electron bombardment.The high-resolution image contrast of a silicon single crystal in the [10] orientation containing a triple divacancy cluster is calculated using the Cowley-Moodie dynamical theory and for a changing gaussian noise level. This divacancy model was deduced from experimental results obtained by electron spin resonance. The calculation condition was for the lMeV Berkeley ARM operated at 800KeV.


Author(s):  
B. G. Demczyk

CoCr thin films have been of interest for a number of years due to their strong perpendicular anisotropy, favoring magnetization normal to the film plane. The microstructure and magnetic properties of CoCr films prepared by both rf and magnetron sputtering have been examined in detail. By comparison, however, relatively few systematic studies of the magnetic domain structure and its relation to the observed film microstructure have been reported. In addition, questions still remain as to the operative magnetization reversal mechanism in different film thickness regimes. In this work, the magnetic domain structure in magnetron sputtered Co-22 at.%Cr thin films of known microstructure were examined by Lorentz transmission electron microscopy. Additionally, domain nucleation studies were undertaken via in-situ heating experiments.It was found that the 50 nm thick films, which are comprised of columnar grains, display a “dot” type domain configuration (Figure 1d), characteristic of a perpendicular magnetization. The domain size was found to be on the order of a few structural columns in diameter.


2021 ◽  
Vol 863 ◽  
pp. 158555
Author(s):  
Paula G. Saiz ◽  
Jose M. Porro ◽  
Andoni Lasheras ◽  
Roberto Fernández de Luis ◽  
Iban Quintana ◽  
...  

2021 ◽  
Vol 135 ◽  
pp. 104145
Author(s):  
Yani P. Latul ◽  
Arnoud W. Kastelein ◽  
Patricia W.T. Beemster ◽  
Nienke E. van Trommel ◽  
Can Ince ◽  
...  

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