scholarly journals Suppressing the Folding of Flowing Viscous Jets Using an Electric Field

2015 ◽  
Vol 3 (3) ◽  
Author(s):  
Tiantian Kong ◽  
Zhou Liu ◽  
Liqiu Wang ◽  
Ho Cheung Shum
Keyword(s):  

Fine jets of slightly conducting viscous fluids and thicker jets or drops of less viscous ones can be drawn from conducting tubes by electric forces. As the potential of the tube relative to a neighbouring plate rises, viscous fluids become nearly conical and fine jets come from the vertices. The potentials at which these jets or drops first appear was measured and compared with calculations. The stability of viscous jets depends on the geometry of the electrodes. Jets as small as 20 μm in diameter and 5 cm long were produced which were quite steady up to a millimetre from their ends. Attempts to describe them mathematically failed. Their stability seems to be due to mechanical rather than electrical causes, like that of a stretched string, which is straight when pulled but bent when pushed. Experiments on the stability of water jets in a parallel electric field reveal two critical fields, one at which jets that are breaking into drops become steady and another at which these steady jets become unsteady again, without breaking into drops. Experiments are described in which a cylindrical soap film becomes unstable under a radial electric field. The results are compared with calculations by A. B. Basset and after a mistake in his analysis is corrected, agreement is found over the range where experiments are possible. Basset’s calculations for axisymmetrical disturbances are extended to those in which the jet moves laterally. Though this is the form in which the instability appears, calculations about uniform jets do not seem to be relevant. In an appendix M. D. Van Dyke calculates the attraction between a long cylinder and a perpendicular plate at a different potential.


Author(s):  
G. F. Rempfer

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.


Author(s):  
Patrick P. Camus

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).


1993 ◽  
Vol 3 (8) ◽  
pp. 1201-1225 ◽  
Author(s):  
G. N�ron de Surgy ◽  
J.-P. Chabrerie ◽  
O. Denoux ◽  
J.-E. Wesfreid

1972 ◽  
Vol 33 (C1) ◽  
pp. C1-63-C1-67 ◽  
Author(s):  
M. BERTOLOTTI ◽  
B. DAINO ◽  
P. Di PORTO ◽  
F. SCUDIERI ◽  
D. SETTE

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