Microwave Device Characterization Using a Widefield Diamond Microscope

Andrew Horsley; Patrick Appel; Janik Wolters; Jocelyn Achard; Alexandre Tallaire; Patrick Maletinsky; Philipp Treutlein

doi:10.1103/physrevapplied.10.044039

Microwave Device Characterization Using a Widefield Diamond Microscope

Physical Review Applied ◽

10.1103/physrevapplied.10.044039 ◽

2018 ◽

Vol 10 (4) ◽

Cited By ~ 19

Author(s):

Andrew Horsley ◽

Patrick Appel ◽

Janik Wolters ◽

Jocelyn Achard ◽

Alexandre Tallaire ◽

...

Keyword(s):

Microwave Device ◽

Device Characterization

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A novel wavelet decomposition technique applied to mrtd microwave device characterization

IEEE International Conference on Systems, Man and Cybernetics ◽

10.1109/icsmc.2002.1168012 ◽

2005 ◽

Author(s):

A. Bendjaballah ◽

M.L. Riabi ◽

M.T. Benhabiles

Keyword(s):

Wavelet Decomposition ◽

Microwave Device ◽

Decomposition Technique ◽

Device Characterization

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Automated Microwave Device Characterization Set-Up Based on a Technology-Independent Generalized Bias System

2005 IEEE Instrumentationand Measurement Technology Conference Proceedings ◽

10.1109/imtc.2005.1604157 ◽

2006 ◽

Author(s):

P.A. Traverso ◽

M. Pirazzini ◽

A. Santarelli ◽

F. Filicori ◽

A. Raffo

Keyword(s):

Microwave Device ◽

Device Characterization ◽

Set Up

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Novel hardware and software solutions for a complete linear and nonlinear microwave device characterization

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/19.293437 ◽

1994 ◽

Vol 43 (2) ◽

pp. 299-305 ◽

Cited By ~ 15

Author(s):

A. Ferrero ◽

F. Sanpietro ◽

U. Pisani ◽

C. Beccari

Keyword(s):

Microwave Device ◽

Device Characterization ◽

Linear And Nonlinear

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Measurement Techniques For Microwave Device Characterization And Modelling

10.1109/mdcm.1990.666349 ◽

1990 ◽

Keyword(s):

Measurement Techniques ◽

Microwave Device ◽

Device Characterization

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Robust Statistical Multi-line TRL Calibration Approach for Microwave Device Characterization

MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference ◽

10.1109/melcon.2006.1653068 ◽

2006 ◽

Author(s):

F.J. Lopez-Gonzalez ◽

E. Marquez-Segura ◽

P. Otero ◽

C. Camacho-Penalosa

Keyword(s):

Microwave Device ◽

Device Characterization ◽

Calibration Approach

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Pulsed I(V) — pulsed RF measurement system for microwave device characterization with 80ns/45GHz

2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2012.6343365 ◽

2012 ◽

Author(s):

Mario Weis ◽

Sebastien Fregonese ◽

Marco Santorelli ◽

Amit Kumar Sahoo ◽

Cristell Maneux ◽

...

Keyword(s):

Measurement System ◽

Microwave Device ◽

Device Characterization ◽

Rf Measurement ◽

Pulsed Rf

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Modulated S-parameter measurements for isothermal microwave device characterization

IEEE Electron Device Letters ◽

10.1109/55.541773 ◽

1996 ◽

Vol 17 (11) ◽

pp. 537-539 ◽

Cited By ~ 2

Author(s):

G. Metze ◽

M. Calcatera ◽

C. Eppers ◽

B. Neidhard ◽

J. Whalen

Keyword(s):

Microwave Device ◽

Device Characterization ◽

S Parameter

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Application of Test & Measure in Microwave Device Characterization

2005 Asia-Pacific Microwave Conference Proceedings ◽

10.1109/apmc.2005.1606995 ◽

2006 ◽

Cited By ~ 1

Author(s):

Zhanfei Chen ◽

Lingling Sun

Keyword(s):

Microwave Device ◽

Device Characterization

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Workshop on Measurement Techniques for Microwave Device Characterization and Modelling

10.1109/mdcm.1990 ◽

1990 ◽

Keyword(s):

Measurement Techniques ◽

Microwave Device ◽

Device Characterization

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A scalable noise de-embedding technique for on-wafer microwave device characterization

IEEE Microwave and Wireless Components Letters ◽

10.1109/lmwc.2005.856685 ◽

2005 ◽

Vol 15 (10) ◽

pp. 649-651 ◽

Cited By ~ 22

Author(s):

Ming-Hsiang Cho ◽

Guo-Wei Huan ◽

Yueh-Hua Wang ◽

Lin-Kun Wu

Keyword(s):

Microwave Device ◽

Device Characterization ◽

Embedding Technique

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