Numerical study of autoionizing states in completely correlated two-electron systems

1994 ◽  
Vol 50 (1) ◽  
pp. 378-391 ◽  
Author(s):  
S. L. Haan ◽  
R. Grobe ◽  
J. H. Eberly
Keyword(s):  
Numerical Study ◽  
Electron Systems ◽  
Autoionizing States

Calculations of (nl)2and (3lnl′) autoionizing states in two-electron systems

2010 ◽  
Vol 82 (3) ◽  
pp. 035301 ◽  
Author(s):  
I Sakho ◽  
A Konté ◽  
A S Ndao ◽  
M Biaye ◽  
A Wagué
Keyword(s):  
Electron Systems ◽  
Autoionizing States

scholarly journals SENECA: a New Program for the Analysis of Single-Electron Devices

VLSI Design ◽  
1998 ◽  
Vol 6 (1-4) ◽  
pp. 57-60 ◽  
Author(s):  
L. R. C. Fonseca ◽  
A. N. Korotkov ◽  
K. K. Likharev
Keyword(s):  
Thermal Activation ◽  
Numerical Study ◽  
Single Electron ◽  
Electron Systems ◽  
Small Deviations ◽  
Finite Speed ◽  
Macroscopic Quantum Tunneling ◽  
Single Electron Devices ◽  
Dc Current ◽  
Hybrid Circuit

We describe a new and efficient method for numerical study of the dynamics and statistics of single-electron systems presenting arbitrary combinations of small tunnel junctions, capacitances, and voltage sources. The method is based on the numerical solution of a master equation describing the time evolution of the probabilities of the electric charge states of the system, with iterative refining of the operational set of states. The method is able to describe very small deviations from the “classical” behavior of a system, due to finite speed of applied signals, thermal activation, and macroscopic quantum tunneling of charge (cotunneling). As an illustration, we briefly study the leakage rate in single-electron traps and the accuracy of several devices (turnstile, pump, and a hybrid circuit) suitable as standards of dc current.

A numerical study of the dynamics and statistics of single electron systems

1995 ◽  
Vol 78 (5) ◽  
pp. 3238-3251 ◽  
Author(s):  
L. R. C. Fonseca ◽  
A. N. Korotkov ◽  
K. K. Likharev ◽  
A. A. Odintsov
Keyword(s):  
Numerical Study ◽  
Single Electron ◽  
Electron Systems
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