Relative Optical Collision Diameters from the Pressure Broadening of Individual Infrared Absorption Lines

1953 ◽  
Vol 91 (2) ◽  
pp. 308-312 ◽  
Author(s):  
William Benesch ◽  
Tait Elder
Keyword(s):  
Infrared Absorption ◽  
Absorption Lines ◽  
Pressure Broadening

Interaction energy of water dimers from pressure broadening of near-IR absorption lines

2008 ◽  
Vol 462 (4-6) ◽  
pp. 188-191 ◽  
Author(s):  
Phyllis A.Y. Fiadzomor ◽  
Anthony M. Keen ◽  
Robert B. Grant ◽  
Andrew J. Orr-Ewing
Keyword(s):  
Interaction Energy ◽  
Absorption Lines ◽  
Ir Absorption ◽  
Pressure Broadening ◽  
Near Ir ◽  
Water Dimers

Infrared Absorption from Low Carbon Concentration, Low Dose, Annealed CZ Silicon

2007 ◽  
Vol 131-133 ◽  
pp. 207-212 ◽  
Author(s):  
N. Inoue ◽  
Y. Goto ◽  
T. Sugiyama
Keyword(s):  
Infrared Absorption ◽  
Carbon Concentration ◽  
Low Dose ◽  
Absorption Lines ◽  
Ir Absorption ◽  
Absorption Analysis ◽  
Low Carbon ◽  
Dose Irradiation ◽  
Highly Sensitive ◽  
Order Of Magnitude

Complexes formed by low dose irradiation with electron (1015-16/cm2) and He (5x1012- 5x1013/cm2) in the relatively low carbon concentration (1016/cm3) MCZ silicon were investigated by highly sensitive and quantitative IR absorption analysis. CiOi and VO were the main complexes in all cases. The concentration of these complexes was about 1015/cm3, or 10% of included carbon in the highest case. Loss of almost equal amount of Cs was observed. The concentration of CiOiI was one order of magnitude lower. Upon annealing, these lines weakened and almost disappeared at 400 oC. There were some absorption lines introduced by the annealing. VO2 was strongest among them and CsOi related structure was also confirmed. There were absorption lines at 954.9 and 962.6 cm-1 appeared after annealing at 300 oC.

On Interpretation of Infrared Absorption Lines

1972 ◽  
Vol 11 (11) ◽  
pp. 2657 ◽  
Author(s):  
John Strong
Keyword(s):  
Infrared Absorption ◽  
Absorption Lines

MEASUREMENT OF PRESSURE-BROADENING LINEWIDTHS OF NO FROM THE FITTING OF LMR SPECTRA WITH CORRECTIONS OF INSTRUMENTAL BROADENING

2000 ◽  
Vol 14 (11) ◽  
pp. 401-407 ◽  
Author(s):  
JIE-LI LIN ◽  
YU-YAN LIU ◽  
HONG-PING LIU ◽  
YUAN-QING QUO ◽  
XIAO-YONG LIU ◽  
...  
Keyword(s):  
Spectral Lines ◽  
Absorption Lines ◽  
Derivative Spectrum ◽  
Pressure Broadening ◽  
Fundamental Band ◽  
Band Spectra

For absorption lines, the distortion of spectral lines by experimental spectrometers must be considered in measuring linewidth which has been investigated by many authors. While in the derivative spectrum, we managed to give the corrections of instrumental broadening and distortion to obtain accurate linewidths. We developed a universal fitting program which was explored together with the method of correction in the fundamental band spectra of LMR of NO. The uncorrected halfwidths were compared with the corrected values, which were obtained from the program. The results of comparison are very satisfactory and demonstrate their useful application to analyze experimental spectra.

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