Particle Groups from the Alpha-Particle Bombardment of Boron

1949 ◽  
Vol 76 (12) ◽  
pp. 1769-1773 ◽  
Author(s):  
Robert J. Creagan
1974 ◽  
Vol 9 (1) ◽  
pp. 267-272 ◽  
Author(s):  
R. H. McKnight ◽  
S. T. Thornton ◽  
R. R. Karlowicz

1971 ◽  
Vol 15 ◽  
pp. 388-406 ◽  
Author(s):  
Ernest J. Franzgrote

The analysis of alpha-excited X-rays has been studied as a possible addition to the alpha-scattering technique used on the Surveyor spacecraft for the first in situ chemical analyses of the lunar surface.Targets of pure elements, simple compounds, and silicate rocks have been exposed to alpha particles and other radiation from a curium-214 source and the resulting X-ray spectra measured by means of a cooled lithium-drifted silicon detector and pulse-height analysis.Alpha-particle bombardment is a simple and efficient means of X-ray excitation for light elements. Useful spectra of silicate rocks may be obtained in a few minutes with a source activity of 50 millicuries, a detector area of 0.1 cm2 and a sample distance of 3 cm. An advantage over electron excitation is the higher characteristic response relative to the bremsstrahlung continuum. Peak-to- background ratios of greater than 100 to 1 have been obtained for elemental targets. Relative efficiencies of X-ray excitation by alpha particles and by X-rays from the curium source have been determined.Resolution of the detector system used is approximately 150 eV for the lighter elements. This is sufficient to resolve the Kα X-rays of the geochemically important elements, Na, Mg, Al, and Si in silicate rocks. Although these and lighter elements are analyzed as well or better by the alpha-scattering and alpha-proton technique, the X-ray mode enables results to be obtained more quickly.The study shows that the addition of an X-ray mode to the alpha-scattering analysis technique would result in a significant improvement in analytical capability for the heavier elements. In particular, important indicators of geochemical differentiation such as K and Ca (which are only marginally separated in an alpha-scattering and alpha-proton analysis) may be determined quantitatively by measuring the alpha-excited X-rays. An X-ray detector is under consideration as an addition to an alpha-scattering instrument now under development for possible use on a Mars-lander mission.


1973 ◽  
Vol 8 (3) ◽  
pp. 1369-1374 ◽  
Author(s):  
Patrick Richard ◽  
R. L. Kauffman ◽  
J. H. McGuire ◽  
C. Fred Moore ◽  
David K. Olsen

2013 ◽  
Vol 438 ◽  
pp. S883-S886
Author(s):  
A. Okamoto ◽  
M. Isobe ◽  
S. Kitajima ◽  
M. Sasao

1981 ◽  
Vol 43 (8) ◽  
pp. 1727-1730 ◽  
Author(s):  
Hisakazu Muramatsu ◽  
Hiromichi Nakahara ◽  
Minoru Yanokura

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