Multiple Scattering of Electrons in the Gas of a Wilson Cloud Chamber

1947 ◽  
Vol 72 (5) ◽  
pp. 357-359 ◽  
Author(s):  
Lyle W. Smith ◽  
P. Gerald Kruger
1947 ◽  
Vol 71 (10) ◽  
pp. 657-660 ◽  
Author(s):  
E. A. Luebke ◽  
G. S. Klaiber ◽  
G. C. Baldwin

Author(s):  
Patrick Maynard Stuart Blackett ◽  
J. G. Wilson

Using an ordinary cloud chamber, Anderson (1933) measured the average angle of scattering of cosmic-ray particles of energy up to 3 x 10 8 e-volts in a lead plate of thickness 1·1 cm. Williams (1936) pointed out that, in such experiments, the scattering is multiple, and that the observed values agreed with the theoretical predictions, assuming the particles to be electrons. Recently Neddermeyer and Anderson (1937) have made some new measure­ments using a counter-controlled cloud chamber and a 1 cm. platinum plate. No numerical results are given, but the observed scattering of particles of energy up to 5 x 10 8 e-volts, which appears to be the limit of the energy measurements, seems in rough agreement with the earlier results. Using the counter-controlled cloud chamber already described by Blackett (1936) and by Blackett and Brode (1936), the multiple scattering of cosmic-ray particles of energy up 9 x 10 9 e-volts in lead and copper plates has been measured. In order to make such measurements possible, it is necessary to reduce as far as possible the distortion of the tracks in the chamber. The technique by which this can be achieved has been described by Blackett and Wilson (1937) in connexion with the measure­ment of the energy loss of rays in traversing metal plates. In fact, the photographs taken for the measurement of the energy loss were, amongst others, found suitable for the measurement of the scattering. The angle of scattering was measured by means of a goniometer eyepiece attached to a travelling microscope. The cross-wires were set tangentially to the track, first on one side and then on the other side of the plate. The mean of the two measured angles of deflexion, obtained from the two stereoscopic photographs, was taken as giving the projection on the plane of the chamber of the actual angle of scattering.


Author(s):  
S. Golladay

The theory of multiple scattering has been worked out by Groves and comparisons have been made between predicted and observed signals for thick specimens observed in a STEM under conditions where phase contrast effects are unimportant. Independent measurements of the collection efficiencies of the two STEM detectors, calculations of the ratio σe/σi = R, where σe, σi are the total cross sections for elastic and inelastic scattering respectively, and a model of the unknown mass distribution are needed for these comparisons. In this paper an extension of this work will be described which allows the determination of the required efficiencies, R, and the unknown mass distribution from the data without additional measurements or models. Essential to the analysis is the fact that in a STEM two or more signal measurements can be made simultaneously at each image point.


Author(s):  
C P Scott ◽  
A J Craven ◽  
C J Gilmore ◽  
A W Bowen

The normal method of background subtraction in quantitative EELS analysis involves fitting an expression of the form I=AE-r to an energy window preceding the edge of interest; E is energy loss, A and r are fitting parameters. The calculated fit is then extrapolated under the edge, allowing the required signal to be extracted. In the case where the characteristic energy loss is small (E < 100eV), the background does not approximate to this simple form. One cause of this is multiple scattering. Even if the effects of multiple scattering are removed by deconvolution, it is not clear that the background from the recovered single scattering distribution follows this simple form, and, in any case, deconvolution can introduce artefacts.The above difficulties are particularly severe in the case of Al-Li alloys, where the Li K edge at ~52eV overlaps the Al L2,3 edge at ~72eV, and sharp plasmon peaks occur at intervals of ~15eV in the low loss region. An alternative background fitting technique, based on the work of Zanchi et al, has been tested on spectra taken from pure Al films, with a view to extending the analysis to Al-Li alloys.


1986 ◽  
Vol 47 (C8) ◽  
pp. C8-589-C8-592
Author(s):  
N. BINSTED ◽  
S. L. COOK ◽  
J. EVANS ◽  
R. J. PRICE ◽  
G. N. GREAVES

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