Experiments on the Reported Fine Structure and the Wave-Length Separation of theKβDoublet in the Molybdenum X-Ray Spectrum

1930 ◽  
Vol 35 (2) ◽  
pp. 149-154 ◽  
Author(s):  
Samuel K. Allison ◽  
John H. Williams
Keyword(s):  
Fine Structure ◽  
Wave Length ◽  
X Ray ◽  
Length Separation

scholarly journals Fine-structure of soft X-ray absorption edges - I—Li, Mg, Ni, Cu metals

1937 ◽  
Vol 161 (906) ◽  
pp. 420-440 ◽  
Keyword(s):  
Fine Structure ◽  
Conduction Electron ◽  
Wave Length ◽  
Ultra Violet ◽  
Short Wave ◽  
Experimental Investigations ◽  
X Rays ◽  
X Ray ◽  
X Ray Absorption

The borderland region between ultra-violet light and X-rays, particularly from about 100 to 300 A, is very suitable for obtaining spectroscopic information regarding the electronic structure of metals, or solids generally. The first step towards this problem consists in the determination of the intensity distribution in the soft X-ray emission bands, which represent transitions from the filled conduction-electron levels of a metal into a vacant inner shell. We thus obtain information relating to the distribution with energy of these filled levels. The most complete experimental investigations of the emission bands are those of Siegbahn and Magnusson (1934) and of O’Bryan and Skinner (1934) for the metals Li, Be, Na, Mg, Al, Si. Subse­quent work showed that the extension of these results to heavier metals is very difficult, because the Auger effect reduces the intensity of the emission by a large factor. The complementary problem is that of absorption, in which we are dealing with transitions from an inner shell of the metal into one of the unoccupied conduction-electron levels of the metal. The probability of such an absorption process is closely connected with the density of the unoccupied levels as a function of energy. The experimental problem therefore consists of the determination of the variation in the absorption coefficient of radiation by electrons of a given inner shell as a function of wave-length; or, as it may be called, the determination of the fine-structure on the short wave-length side of an X-ray absorption edge of a metal.

Extended Core Edge Fine Structure in the E.M.

1980 ◽  
Vol 38 ◽  
pp. 120-121
Author(s):  
R.D. Leapman
Keyword(s):  
Fine Structure ◽  
Electron Scattering ◽  
Inelastic Electron ◽  
High Resolution Imaging ◽  
X Ray ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Core Electrons ◽  
Resolution Imaging ◽  
X Ray Absorption

Extended X-ray Absorption Fine Structure (EXAFS) analysis makes use of synchrotron radiaion to measure modulations in the absorption coefficient above core edges and hence to obtain information about local atomic environments. EXAFS arises when ejected core electrons are backscattered by surrounding atoms and interfere with the outgoing waves. Recently, interest has also been shown in using inelastic electron scattering1-4. Some advantages of Extended X-ray-edge Energy Loss Fine Structure (EXELFS) are: a) small probes formed by the analytical electron microscope give spectra from μm to nm sized areas, compared with mm diameter areas for the X-ray technique, b) EXELFS can be combined with other techniques such as electron diffraction or high resolution imaging, and c) EXELFS is sensitive to low Z elements with K edges from ˜200 eV to ˜ 3000 eV (B to Cl).

Some Aspects of Exelfs Analysis in the Electron Microscope

1980 ◽  
Vol 38 ◽  
pp. 118-119
Author(s):  
D. E. Johnson ◽  
S. Csillag
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Energy Loss ◽  
Analytical Electron Microscopy ◽  
Interference Effects ◽  
Interatomic Distances ◽  
X Ray ◽  
Structure Information ◽  
Microanalytical Technique ◽  
Analytical Electron

Recently, the applications area of analytical electron microscopy has been extended to include the study of Extended Energy Loss Fine Structure (EXELFS). Modulations past an ionization edge in the energy loss spectrum (EXELFS), contain atomic fine structure information similar to Extended X-ray Absorbtion Fine Structure (EXAFS). At low momentum transfer the main contribution to these modulations comes from interference effects between the outgoing excited inner shell electron waves and electron waves backscattered from the surrounding atoms. The ability to obtain atomic fine structure information (such as interatomic distances) combined with the spatial resolution of an electron microscope is unique and makes EXELFS an important microanalytical technique.

EXTENDED X-RAY BREMSSTRAHLUNG ISOCHROMAT FINE STRUCTURE

1987 ◽  
Vol 48 (C9) ◽  
pp. C9-1121-C9-1124
Author(s):  
E. SOBCZAK ◽  
J. AULEYTNER
Keyword(s):  
Fine Structure ◽  
X Ray

Structure of magnetic thin films and nanostructures studied by extended X-ray absorption fine structure

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Magnetic Thin Films ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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