Power Spectrum of Light Scattered by Two-Level Systems

1969 ◽  
Vol 188 (5) ◽  
pp. 1969-1975 ◽  
Author(s):  
B. R. Mollow
Keyword(s):  
Power Spectrum ◽  
Two Level Systems

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Log-log scale roughness spectroscopy of surfaces

1993 ◽  
Vol 51 ◽  
pp. 224-225
Author(s):  
P. Fraundorf ◽  
B. Armbruster
Keyword(s):  
Power Spectrum ◽  
Autocorrelation Function ◽  
Power Spectra ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Lateral Structure ◽  
Scale Roughness

Optical interferometry, confocal light microscopy, stereopair scanning electron microscopy, scanning tunneling microscopy, and scanning force microscopy, can produce topographic images of surfaces on size scales reaching from centimeters to Angstroms. Second moment (height variance) statistics of surface topography can be very helpful in quantifying “visually suggested” differences from one surface to the next. The two most common methods for displaying this information are the Fourier power spectrum and its direct space transform, the autocorrelation function or interferogram. Unfortunately, for a surface exhibiting lateral structure over several orders of magnitude in size, both the power spectrum and the autocorrelation function will find most of the information they contain pressed into the plot’s origin. This suggests that we plot power in units of LOG(frequency)≡-LOG(period), but rather than add this logarithmic constraint as another element of abstraction to the analysis of power spectra, we further recommend a shift in paradigm.

DIELECTRIC EVIDENCE FOR EXISTENCE OF TWO-LEVEL-SYSTEMS IN CYCLOHEXANOL, A " GLASSY CRYSTAL " SYSTEM

1982 ◽  
Vol 43 (C9) ◽  
pp. C9-525-C9-527
Author(s):  
G. P. Singh ◽  
R. Vacher ◽  
R. Calemczuk
Keyword(s):  
Crystal System ◽  
Two Level Systems

INSTABILITIES IN THE POWER SPECTRUM OF MODE-LOCKED SEMICONDUCTOR LASERS

1988 ◽  
Vol 49 (C2) ◽  
pp. C2-405-C2-408 ◽  
Author(s):  
D. BAUMS ◽  
M. SERÉNYI ◽  
W. ELSÄSSER ◽  
E. O. GÖBEL
Keyword(s):  
Power Spectrum ◽  
Semiconductor Lasers

Orientation holes positioning of printed board based on LS-Power spectrum density algorithm

2018 ◽  
Vol 35 (3-4) ◽  
pp. 277-288
Author(s):  
Xiaxia ZENG ◽  
Zhenhua SONG ◽  
Wenzhong LIN ◽  
Haibo LUO
Keyword(s):  
Power Spectrum ◽  
Power Spectrum Density ◽  
Spectrum Density

Speech Intelligibility Prediction Based on the Envelope Power Spectrum Model with the Dynamic Compressive Gammachirp Auditory Filterbank

2016 ◽  
Author(s):  
Katsuhiko Yamamoto ◽  
Toshio Irino ◽  
Toshie Matsui ◽  
Shoko Araki ◽  
Keisuke Kinoshita ◽  
...  
Keyword(s):  
Power Spectrum ◽  
Speech Intelligibility ◽  
Spectrum Model
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