Relaxation and Activation Energies for an Interstitial Neutral Defect in an Alkali Halide Lattice

1961 ◽  
Vol 124 (3) ◽  
pp. 726-735 ◽  
Author(s):  
Robert D. Hatcher ◽  
G. J. Dienes
1997 ◽  
Vol 299 (1-2) ◽  
pp. 59-65 ◽  
Author(s):  
Hiroyuki Kawano ◽  
Yongfa Zhu ◽  
Susumu Kamidoi ◽  
Hironari Shimizu ◽  
Masayuki Udaka

1997 ◽  
Vol 92 (6) ◽  
pp. 1029-1033
Author(s):  
A. BATANA ◽  
J. BRUNO ◽  
R.W. MUNN

2002 ◽  
Vol 719 ◽  
Author(s):  
Masashi Kato ◽  
Masaya Ichimura ◽  
Eisuke Arai ◽  
Shigehiro Nishino

AbstractEpitaxial layers of 4H-SiC are grown on (0001) substrates inclined toward <1120> and <1100> directions. Defects in these films are characterized by deep level transient spectroscopy (DLTS) in order to clarify the dependence of concentrations and activation energies on substrate inclination. DLTS results show no such dependence on substrate inclination but show thickness dependence of the concentration.


2015 ◽  
Vol 19 (1/2) ◽  
Author(s):  
L. I. Panasjuk ◽  
V. V. Kolomoets ◽  
V. N. Ermakov ◽  
S. A. Fedosov ◽  
L. V. Yashchynskiy

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