Theory of Ionization Probability Near Threshold

1956 ◽  
Vol 102 (1) ◽  
pp. 171-179 ◽  
Author(s):  
Sydney Geltman
Keyword(s):  
Ionization Probability ◽  
Near Threshold

Measurement of the near-threshold Auger ionization probability in silicon

1995 ◽  
Vol 7 (35) ◽  
pp. 7037-7043 ◽  
Author(s):  
I V Grekhov ◽  
A F Shulekin ◽  
M I Vexler
Keyword(s):  
Ionization Probability ◽  
Near Threshold

Ionization Probability Curves for Krypton and Xenon near Threshold

1953 ◽  
Vol 89 (3) ◽  
pp. 555-558 ◽  
Author(s):  
R. E. Fox ◽  
W. M. Hickam ◽  
T. Kjeldaas
Keyword(s):  
Ionization Probability ◽  
Near Threshold

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

Hearing in Mice via GSR Audiometry

1963 ◽  
Vol 6 (4) ◽  
pp. 359-368 ◽  
Author(s):  
Charles I. Berlin
Keyword(s):  
Inverse Relationship ◽  
Sound Pressure ◽  
Single Units ◽  
Sensitivity Curve ◽  
Basic Tool ◽  
Eighth Nerve ◽  
Pure Tones ◽  
Conditioned Responses ◽  
Frequency Intensity ◽  
Near Threshold

Hearing in mice has been difficult to measure behaviorally. With GSR as the basic tool, the sensitivity curve to pure tones in mice has been successfully outlined. The most sensitive frequency-intensity combination was 15 000 cps at 0-5 dB re: 0.0002 dyne/cm 2 , with responses noted from 1 000 to beyond 70 000 cps. Some problems of reliability of conditioning were encountered, as well as findings concerning the inverse relationship between the size of GSR to unattenuated tones and the sound pressure necessary to elicit conditioned responses at or near threshold. These data agree well with the sensitivity of single units of the eighth nerve of the mouse.

Reliability of odor measurements near threshold.

1988 ◽  
Author(s):  
Birgitta Berglund ◽  
Lennart Hoegman ◽  
Ingegerd Johansson
Keyword(s):  
Near Threshold

NEAR THRESHOLD MEASUREMENTS OF THE K SHELL SATELLITES OF CO AND N2

1987 ◽  
Vol 48 (C9) ◽  
pp. C9-773-C9-776 ◽  
Author(s):  
J. FELDHAUS ◽  
A. REIMER ◽  
J. SCHIRMER ◽  
A. M. BRADSHAW ◽  
U. BECKER ◽  
...  
Keyword(s):  
Near Threshold

scholarly journals Non-GCA modeling of near threshold I-V characteristics of DG MOSFETs

2020 ◽  
Vol 166 ◽  
pp. 107766
Author(s):  
Zhongjie Ren ◽  
Yuan Taur
Keyword(s):  
Near Threshold
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