The reconstruction and functional mapping of a recurrent microcircuit in Drosophila mushroom body

2019 ◽  
Author(s):  
Guangxia Wang ◽  
Bangyu Zhou ◽  
Shengxiong Wang ◽  
Kai Yang ◽  
Jianjian Zhao ◽  
...  

AbstractIn Drosophila melanogaster, mushroom body and anterior paired lateral (APL) neurons play important roles not only in learning and memory but also in high cognitive behavior, reversal learning. The circuit between APL neurons and Kenyon cells (KCs) in the mushroom body underlies this behavior, including reversal learning, and electron microscopy (EM) methods must be used to reveal this circuit. Here, we reconstructed the connections between mushroom body cells and APL neurons in the vertical lobe of the mushroom body via focused ion beam scanning electron microscopy (FIB-SEM) and sparse genetic horseradish peroxidase (HRP) labeling. We offer the first EM evidence that recurrent network and lateral inhibition connections exist between APL neurons and KCs in the vertical lobe of the mushroom body. This circuit is the neural basis of action selection decision making, associative learning and reversal learning. Additionally, dopamine neurons project to different areas of mushroom bodies and, together with extrinsic neurons and KC axons, form a compartmental structure of mushroom body axons, thereby restricting the KC-mushroom body output neuron (MBON) response to local compartments. Whether APL neurons also respond locally is uncertain. We found that APL neurons exhibited input and output synapses that were intermixed and arranged on enlarged and thin sections, respectively, resembling a string of beads. Different KCs were found to project to APL neurons nonrepetitively, forming a local circuit structure. Furthermore, using a single neurite calcium imaging method, we identified local calcium domains on this circuit, suggestive of individual electrical compartments. The electrically recorded APL neurons were nonspike neurons that selectively responded to odor in both the lobes and calyx. Thus, the localized APL neuron responses coordinate with mushroom body–dopamine-MBON compartmental function.

2014 ◽  
Vol 20 (2) ◽  
pp. 537-547 ◽  
Author(s):  
Boyin Liu ◽  
Heidi H. Yu ◽  
Tuck Wah Ng ◽  
David L. Paterson ◽  
Tony Velkov ◽  
...  

AbstractAntibiotic resistance is a major risk to human health, and to provide valuable insights into mechanisms of resistance, innovative methods are needed to examine the cellular responses to antibiotic treatment. Focused ion beam tomography is proposed to image and assess the detailed three-dimensional (3D) ultrastructure of single bacterial cells. By iteratively removing slices of thickness in the order of 10 nm, high magnification 2D images can be acquired by scanning electron microscopy at single-digit nanometer resolution. In this study,Klebsiella pneumoniaewas treated with polymyxin B, and 3D models of both cell envelope and cytoplasm regions containing the nucleoid and ribosomes were reconstructed. The 3D volume containing the nucleoid and ribosomes was significantly smaller, and the cell length along the longitudinal axis was extended by 40% in the treated cells, implying stress responses to the drug treatment. More than a 200% increase in protrusions per unit surface area on the cell envelope was observed in the curvature analysis after treatment. Experiments by conventional transmission electron microscopy and atomic force microscopy were also performed, followed by comparison and discussions. In conclusion, the proposed 3D imaging method and associated analysis provide a unique tool for the assessment of antibiotic effects on multidrug-resistant bacteria at nanometer resolution.


Geology ◽  
2021 ◽  
Author(s):  
Bernardo Cesare ◽  
Nicola Campomenosi ◽  
Michael Shribak

Polychromatic polarizing microscopy (PPM) is a new optical technique that allows for the inspection of materials with low birefringence, which produces retardance between 1 nm and 300 nm. In this region, where minerals display interference colors in the near-black to gray scale and where observations by conventional microscopy are limited or hampered, PPM produces a full spectrum color palette in which the hue depends on orientation of the slow axis. We applied PPM to ordinary 30 μm rock thin sections, with particular interest in the subtle birefringence of garnet due both to non-isotropic growth or to strain induced by external stresses or inclusions. The PPM produces striking, colorful images that highlight various types of microstructures that are virtually undetectable by conventional polarizing microscopy. PPM opens new avenues for microstructural analysis of geological materials. The direct detection and imaging of microstructures will provide a fast, non-destructive, and inexpensive alternative (or complement) to time-consuming and more costly scanning electron microscope–based analyses such as electron backscatter diffraction. This powerful imaging method provides a quick and better texturally constrained basis for locating targets for cutting-edge applications such as focused ion beam-transmission electron microscopy or atom probe tomography.


2014 ◽  
Vol 20 (4) ◽  
pp. 1111-1119 ◽  
Author(s):  
Monique Y. Rennie ◽  
Curran G. Gahan ◽  
Claudia S. López ◽  
Kent L. Thornburg ◽  
Sandra Rugonyi

AbstractEarly embryonic heart development is a period of dynamic growth and remodeling, with rapid changes occurring at the tissue, cell, and subcellular levels. A detailed understanding of the events that establish the components of the heart wall has been hampered by a lack of methodologies for three-dimensional (3D), high-resolution imaging. Focused ion beam scanning electron microscopy (FIB-SEM) is a novel technology for imaging 3D tissue volumes at the subcellular level. FIB-SEM alternates between imaging the block face with a scanning electron beam and milling away thin sections of tissue with a FIB, allowing for collection and analysis of 3D data. FIB-SEM was used to image the three layers of the day 4 chicken embryo heart: myocardium, cardiac jelly, and endocardium. Individual images obtained with FIB-SEM were comparable in quality and resolution to those obtained with transmission electron microscopy. Up to 1,100 serial images were obtained in 4 nm increments at 4.88 nm resolution, and image stacks were aligned to create volumes 800–1,500 μm3 in size. Segmentation of organelles revealed their organization and distinct volume fractions between cardiac wall layers. We conclude that FIB-SEM is a powerful modality for 3D subcellular imaging of the embryonic heart wall.


2018 ◽  
Vol 45 (2) ◽  
pp. 180 ◽  
Author(s):  
Brandon C. Reagan ◽  
Paul J. -Y. Kim ◽  
Preston D. Perry ◽  
John R. Dunlap ◽  
Tessa M. Burch-Smith

Analysis of cellular ultrastructure has been dominated by transmission electron microscopy (TEM), so images collected by this technique have shaped our current understanding of cellular structure. More recently, three-dimensional (3D) analysis of organelle structures has typically been conducted using TEM tomography. However, TEM tomography application is limited by sample thickness. Focused ion beam-scanning electron microscopy (FIB-SEM) uses a dual beam system to perform serial sectioning and imaging of a sample. Thus FIB-SEM is an excellent alternative to TEM tomography and serial section TEM tomography. Animal tissue samples have been more intensively investigated by this technique than plant tissues. Here, we show that FIB-SEM can be used to study the 3D ultrastructure of plant tissues in samples previously prepared for TEM via commonly used fixation and embedding protocols. Reconstruction of FIB-SEM sections revealed ultra-structural details of the plant tissues examined. We observed that organelles packed tightly together in Nicotiana benthamiana Domin leaf cells may form membrane contacts. 3D models of soybean nodule cells suggest that the bacteroids in infected cells are contained within one large membrane-bound structure and not the many individual symbiosomes that TEM thin-sections suggest. We consider the implications of these organelle arrangements for intercellular signalling.


Author(s):  
Ching Shan Sung ◽  
Hsiu Ting Lee ◽  
Jian Shing Luo

Abstract Transmission electron microscopy (TEM) plays an important role in the structural analysis and characterization of materials for process evaluation and failure analysis in the integrated circuit (IC) industry as device shrinkage continues. It is well known that a high quality TEM sample is one of the keys which enables to facilitate successful TEM analysis. This paper demonstrates a few examples to show the tricks on positioning, protection deposition, sample dicing, and focused ion beam milling of the TEM sample preparation for advanced DRAMs. The micro-structures of the devices and samples architectures were observed by using cross sectional transmission electron microscopy, scanning electron microscopy, and optical microscopy. Following these tricks can help readers to prepare TEM samples with higher quality and efficiency.


Author(s):  
H.J. Ryu ◽  
A.B. Shah ◽  
Y. Wang ◽  
W.-H. Chuang ◽  
T. Tong

Abstract When failure analysis is performed on a circuit composed of FinFETs, the degree of defect isolation, in some cases, requires isolation to the fin level inside the problematic FinFET for complete understanding of root cause. This work shows successful application of electron beam alteration of current flow combined with nanoprobing for precise isolation of a defect down to fin level. To understand the mechanism of the leakage, transmission electron microscopy (TEM) slice was made along the leaky drain contact (perpendicular to fin direction) by focused ion beam thinning and lift-out. TEM image shows contact and fin. Stacking fault was found in the body of the silicon fin highlighted by the technique described in this paper.


Author(s):  
K. Doong ◽  
J.-M. Fu ◽  
Y.-C. Huang

Abstract The specimen preparation technique using focused ion beam (FIB) to generate cross-sectional transmission electron microscopy (XTEM) samples of chemical vapor deposition (CVD) of Tungsten-plug (W-plug) and Tungsten Silicides (WSix) was studied. Using the combination method including two axes tilting[l], gas enhanced focused ion beam milling[2] and sacrificial metal coating on both sides of electron transmission membrane[3], it was possible to prepare a sample with minimal thickness (less than 1000 A) to get high spatial resolution in TEM observation. Based on this novel thinning technique, some applications such as XTEM observation of W-plug with different aspect ratio (I - 6), and the grain structure of CVD W-plug and CVD WSix were done. Also the problems and artifacts of XTEM sample preparation of high Z-factor material such as CVD W-plug and CVD WSix were given and the ways to avoid or minimize them were suggested.


Author(s):  
Chin Kai Liu ◽  
Chi Jen. Chen ◽  
Jeh Yan.Chiou ◽  
David Su

Abstract Focused ion beam (FIB) has become a useful tool in the Integrated Circuit (IC) industry, It is playing an important role in Failure Analysis (FA), circuit repair and Transmission Electron Microscopy (TEM) specimen preparation. In particular, preparation of TEM samples using FIB has become popular within the last ten years [1]; the progress in this field is well documented. Given the usefulness of FIB, “Artifact” however is a very sensitive issue in TEM inspections. The ability to identify those artifacts in TEM analysis is an important as to understanding the significance of pictures In this paper, we will describe how to measure the damages introduced by FIB sample preparation and introduce a better way to prevent such kind of artifacts.


Author(s):  
J. Douglass ◽  
T. D. Myers ◽  
F. Tsai ◽  
R. Ketcheson ◽  
J. Errett

Abstract This paper describes how the authors used a combination of focused ion beam (FIB) microprobing, transmission electron microscopy (TEM), and data and process analysis to determine that localized water residue was causing a 6% yield loss at die sort.


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