Single-atom manipulations in a microscopic dipole trap

2003 ◽  
Vol 361 (1808) ◽  
pp. 1527-1536 ◽  
Author(s):  
Georges Reymond ◽  
Nicolas Schlosser ◽  
Igor Protsenko ◽  
Philippe Grangier
Keyword(s):  
Single Atom ◽  
Dipole Trap

scholarly journals Single atom Rydberg excitation in a small dipole trap

2009 ◽  
Vol 17 (25) ◽  
pp. 22898 ◽  
Author(s):  
Zhanchun Zuo ◽  
Miho Fukusen ◽  
Yoshihiro Tamaki ◽  
Tomoki Watanabe ◽  
Yusuke Nakagawa ◽  
...  
Keyword(s):  
Single Atom ◽  
Dipole Trap ◽  
Small Dipole

Extending the trapping lifetime of single atom in a microscopic far-off-resonance optical dipole trap

2011 ◽  
Vol 6 (3) ◽  
pp. 262-270 ◽  
Author(s):  
Jun He ◽  
Bao-dong Yang ◽  
Yong-jie Cheng ◽  
Tian-cai Zhang ◽  
Jun-min Wang
Keyword(s):  
Single Atom ◽  
Dipole Trap ◽  
Optical Dipole Trap

Measurement and 3D Reconstruction of the Micro-scale Optical Dipole Trap for Single Atom Manipulation

2015 ◽  
Vol 21 (1) ◽  
pp. 74-80 ◽  
Author(s):  
王建龙 WANG Jian-long ◽  
李刚 LI Gang ◽  
田亚莉 TIAN Ya-li ◽  
张天才 ZHANG Tian-cai
Keyword(s):  
3D Reconstruction ◽  
Single Atom ◽  
Dipole Trap ◽  
Optical Dipole Trap ◽  
Micro Scale ◽  
Atom Manipulation

scholarly journals Analysis of a single-atom dipole trap

2006 ◽  
Vol 73 (4) ◽  
Author(s):  
Markus Weber ◽  
Jürgen Volz ◽  
Karen Saucke ◽  
Christian Kurtsiefer ◽  
Harald Weinfurter
Keyword(s):  
Single Atom ◽  
Dipole Trap

Single atom dipole trap

2003 ◽  
Author(s):  
J. Volz ◽  
M. Weber ◽  
R. Reicold ◽  
K. Saucke ◽  
C. Kurtsiefer ◽  
...  
Keyword(s):  
Single Atom ◽  
Dipole Trap

scholarly journals Raman sideband cooling of a single atom in an optical dipole trap: Toward a theoretical optimum in a three-dimensional regime

2019 ◽  
Vol 99 (4) ◽  
Author(s):  
V. M. Porozova ◽  
L. V. Gerasimov ◽  
I. B. Bobrov ◽  
S. S. Straupe ◽  
S. P. Kulik ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Single Atom ◽  
Dipole Trap ◽  
Optical Dipole Trap ◽  
Sideband Cooling

scholarly journals Single Atom Manipulation in a Microscopic Dipole Trap

2003 ◽  
Author(s):  
Georges Reymond ◽  
Nicolas Schlosser ◽  
Philippe Grangier
Keyword(s):  
Single Atom ◽  
Dipole Trap ◽  
Atom Manipulation

Single Atom Image Contrast in Fixed Beam Dark Field Electron Microscopy

1974 ◽  
Vol 32 ◽  
pp. 366-367
Author(s):  
Wah Chi
Keyword(s):  
Scattering Amplitude ◽  
Present Report ◽  
Dark Field ◽  
Image Contrast ◽  
Single Atom ◽  
Optical Theorem ◽  
Hartree Fock ◽  
Heavy Atoms ◽  
Beam Stop ◽  
Fixed Beam

Resolution and contrast are the important factors to determine the feasibility of imaging single heavy atoms on a thin substrate in an electron microscope. The present report compares the atom image characteristics in different modes of fixed beam dark field microscopy including the ideal beam stop (IBS), a wire beam stop (WBS), tilted illumination (Tl) and a displaced aperture (DA). Image contrast between one Hg and a column of linearly aligned carbon atoms (representing the substrate), are also discussed. The assumptions in the present calculations are perfectly coherent illumination, atom object is represented by spherically symmetric potential derived from Relativistic Hartree Fock Slater wave functions, phase grating approximation is used to evaluate the complex scattering amplitude, inelastic scattering is ignored, phase distortion is solely due to defocus and spherical abberation, and total elastic scattering cross section is evaluated by the Optical Theorem. The atom image intensities are presented in a Z-modulation display, and the details of calculation are described elsewhere.

Atomic Spectroscopy in the FIM

1986 ◽  
Vol 44 ◽  
pp. 758-761
Author(s):  
J. J. Hren ◽  
S. D. Walck
Keyword(s):  
Electron Microscope ◽  
Electric Fields ◽  
Atom Probe ◽  
Atomic Spectroscopy ◽  
Single Atom ◽  
Statistical Sampling ◽  
Commercial Instrument ◽  
Available Technology ◽  
High Electric Fields ◽  
Field Ion Microscope

The field ion microscope (FIM) has had the ability to routinely image the surface atoms of metals since Mueller perfected it in 1956. Since 1967, the TOF Atom Probe has had single atom sensitivity in conjunction with the FIM. “Why then hasn't the FIM enjoyed the success of the electron microscope?” The answer is closely related to the evolution of FIM/Atom Probe techniques and the available technology. This paper will review this evolution from Mueller's early discoveries, to the development of a viable commercial instrument. It will touch upon some important contributions of individuals and groups, but will not attempt to be all inclusive. Variations in instrumentation that define the class of problems for which the FIM/AP is uniquely suited and those for which it is not will be described. The influence of high electric fields inherent to the technique on the specimens studied will also be discussed. The specimen geometry as it relates to preparation, statistical sampling and compatibility with the TEM will be examined.

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