X-ray spectroscopy of laser imploded targets

X-ray spectroscopy provides a variety of means for studying the interaction of lasers with plasmas, in particular the interaction with imploding targets in inertial confinement fusion. A typical fusion target is composed of materials other than the thermonuclear fuel which play a variety of roles (tamping, shielding, thermal isolation, etc.). These structural elements emit characteristic X-ray lines and continua, and through their spectral and spatial distributions can yield very valuable information on the interaction and implosion dynamics. Examples are the study of heat conductivity, the mixing of different target layers, and the determination of temperature and density at the compressed target core. Results will be shown for electron densities N e = 10 24 cm -3 and temperatures T = 1 keV measured during compression of argon-filled targets with a six-beam laser of peak power 2 TW.

2020 ◽  
Vol 127 (8) ◽  
pp. 083301 ◽  
Author(s):  
P. L. Volegov ◽  
S. H. Batha ◽  
V. Geppert-Kleinrath ◽  
C. R. Danly ◽  
F. E. Merrill ◽  
...  

Author(s):  
C. W. Price ◽  
E. F. Lindsey

Thickness measurements of thin films are performed by both energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence (XRF). XRF can measure thicker films than EDS, and XRF measurements also have somewhat greater precision than EDS measurements. However, small components with curved or irregular shapes that are used for various applications in the the Inertial Confinement Fusion program at LLNL present geometrical problems that are not conducive to XRF analyses but may have only a minimal effect on EDS analyses. This work describes the development of an EDS technique to measure the thickness of electroless nickel deposits on gold substrates. Although elaborate correction techniques have been developed for thin-film measurements by x-ray analysis, the thickness of electroless nickel films can be dependent on the plating bath used. Therefore, standard calibration curves were established by correlating EDS data with thickness measurements that were obtained by contact profilometry.


2011 ◽  
Vol 18 (3) ◽  
pp. 032706 ◽  
Author(s):  
R. E. Olson ◽  
G. A. Rochau ◽  
O. L. Landen ◽  
R. J. Leeper

2013 ◽  
Vol 22 (10) ◽  
pp. 104202
Author(s):  
Zong-Qing Zhao ◽  
Wei-Hua He ◽  
Jian Wang ◽  
Yi-Dan Hao ◽  
Lei-Feng Cao ◽  
...  

2019 ◽  
Vol 26 (6) ◽  
pp. 062702 ◽  
Author(s):  
T. R. Joshi ◽  
S. C. Hsu ◽  
P. Hakel ◽  
N. M. Hoffman ◽  
H. Sio ◽  
...  

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