Lung counting: comparison of detector performance with a four detector array that has either metal or carbon fibre end caps, and the effect on mda calculation

2012 ◽  
Vol 151 (2) ◽  
pp. 262-266 ◽  
Author(s):  
A. S. Ahmed ◽  
B. Hauck ◽  
G. H. Kramer
Author(s):  
E. B. Steel

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.


2012 ◽  
Vol 54 (11-12) ◽  
pp. 756-761 ◽  
Author(s):  
Maik Gude ◽  
Werner Hufenbach ◽  
Ilja Koch ◽  
Roman Koschichow

2016 ◽  
Vol 53 (3) ◽  
pp. 125-143
Author(s):  
S. González ◽  
M. González ◽  
J. Dominguez ◽  
F. Lasagni

Author(s):  
Jim Vickers ◽  
Nader Pakdaman ◽  
Steven Kasapi

Abstract Dynamic hot-electron emission using time-resolved photon counting can address the long-term failure analysis and debug requirements of the semiconductor industry's advanced devices. This article identifies the detector performance parameters and components that are required to scale and keep pace with the industry's requirements. It addresses the scalability of dynamic emission with the semiconductor advanced device roadmap. It is important to understand the limitations to determining that a switching event has occurred. The article explains the criteria for event detection, which is suitable for tracking signal propagation and looking for logic or other faults in which timing is not critical. It discusses conditions for event timing, whose goal is to determine accurately when a switching event has occurred, usually for speed path analysis. One of the uses of a dynamic emission system is to identify faults by studying the emission as a general function of time.


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