Power spectrum multipoles on the curved sky: an application to the 6-degree Field Galaxy Survey

Chris Blake; Paul Carter; Jun Koda

doi:10.1093/mnras/sty1814

Power spectrum multipoles on the curved sky: an application to the 6-degree Field Galaxy Survey

Monthly Notices of the Royal Astronomical Society ◽

10.1093/mnras/sty1814 ◽

2018 ◽

Vol 479 (4) ◽

pp. 5168-5183 ◽

Cited By ~ 15

Author(s):

Chris Blake ◽

Paul Carter ◽

Jun Koda

Keyword(s):

Power Spectrum ◽

Field Galaxy

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The DWT Power Spectrum of the two-degree Field Galaxy Redshift Survey

10.1063/1.2837025 ◽

2008 ◽

Author(s):

Yan-Chuan Cai ◽

Jun Pan ◽

Yong-Heng Zhao ◽

Long-Long Feng ◽

Li-Zhi Fang ◽

...

Keyword(s):

Power Spectrum ◽

Redshift Survey ◽

Galaxy Redshift ◽

Field Galaxy

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DWT Power Spectrum of the Two-Degree Field Galaxy Redshift Survey

Chinese Journal of Astronomy and Astrophysics ◽

10.1088/1009-9271/8/2/04 ◽

2008 ◽

Vol 8 (2) ◽

pp. 159-178

Author(s):

Yan-Chuan Cai ◽

Jun Pan ◽

Yong-Heng Zhao ◽

Long-Long Feng ◽

Li-Zhi Fang

Keyword(s):

Power Spectrum ◽

Redshift Survey ◽

Galaxy Redshift ◽

Field Galaxy

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The on-line use of histogram data for high-speed correction and alignment of electron microscope images

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100112713 ◽

1984 ◽

Vol 42 ◽

pp. 556-557

Author(s):

William Krakow

Keyword(s):

Power Spectrum ◽

High Speed ◽

Direct Memory Access ◽

Digital Television ◽

Contrast Transfer Function ◽

The Past ◽

High Resolution Tem ◽

On Line ◽

Correction Of Astigmatism ◽

The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

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Log-log scale roughness spectroscopy of surfaces

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100146965 ◽

1993 ◽

Vol 51 ◽

pp. 224-225

Author(s):

P. Fraundorf ◽

B. Armbruster

Keyword(s):

Power Spectrum ◽

Autocorrelation Function ◽

Power Spectra ◽

Scanning Force Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Scanning Force ◽

Lateral Structure ◽

Scale Roughness

Optical interferometry, confocal light microscopy, stereopair scanning electron microscopy, scanning tunneling microscopy, and scanning force microscopy, can produce topographic images of surfaces on size scales reaching from centimeters to Angstroms. Second moment (height variance) statistics of surface topography can be very helpful in quantifying “visually suggested” differences from one surface to the next. The two most common methods for displaying this information are the Fourier power spectrum and its direct space transform, the autocorrelation function or interferogram. Unfortunately, for a surface exhibiting lateral structure over several orders of magnitude in size, both the power spectrum and the autocorrelation function will find most of the information they contain pressed into the plot’s origin. This suggests that we plot power in units of LOG(frequency)≡-LOG(period), but rather than add this logarithmic constraint as another element of abstraction to the analysis of power spectra, we further recommend a shift in paradigm.

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