scholarly journals Chromospheric plasma ejection above a pore

2020 ◽  
Vol 493 (2) ◽  
pp. 3036-3044
Author(s):  
L Bharti ◽  
B Sobha ◽  
C Quintero Noda ◽  
C Joshi ◽  
U Pandya
Keyword(s):  
Fine Structure ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Opposite Polarity ◽  
Vertical Field ◽  
Polarity Field ◽  
Low Altitude ◽  
Umbral Dots ◽  
Field Lines ◽  
A Current

ABSTRACT We present high spatial resolution observations of short-lived transients, ribbons and jet-like events above a pore in Ca ii H images where fine structure, like umbral dots, light bridges and penumbral microfilaments, is present in the underlying photosphere. We found that current layers are formed at the edges of the convective fine structure, due to the shear between their horizontal field and the ambient vertical field. High vertical electric current density patches are observed in the photosphere around these events, which indicates the formation of a current sheet at the reconnection site. In the framework of past studies, low altitude reconnection could be the mechanism that produces such events. The reconnection is caused by an opposite polarity field produced by the bending of field lines by convective downflows at the edge of pore fine structure.

A sub-micrometer resolution hard X-ray microprobe system of BL8C at Pohang Light Source

2015 ◽  
Vol 22 (5) ◽  
pp. 1306-1311 ◽  
Author(s):  
Nark-Eon Sung ◽  
Ik-Jae Lee ◽  
Kug-Seong Lee ◽  
Seong-Hun Jeong ◽  
Seen-Woong Kang ◽  
...  
Keyword(s):  
Trace Elements ◽  
Fine Structure ◽  
South Korea ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Structural Information ◽  
Complex Materials ◽  
X Ray ◽  
Pohang Light Source ◽  
X Ray Absorption

A microprobe system has been installed on the nanoprobe/XAFS beamline (BL8C) at PLS-II, South Korea. Owing to the reproducible switch of the gap of the in-vacuum undulator (IVU), the intense and brilliant hard X-ray beam of an IVU can be used in X-ray fluorescence (XRF) and X-ray absorption fine-structure (XAFS) experiments. For high-spatial-resolution microprobe experiments a Kirkpatrick–Baez mirror system has been used to focus the millimeter-sized X-ray beam to a micrometer-sized beam. The performance of this system was examined by a combination of micro-XRF imaging and micro-XAFS of a beetle wing. These results indicate that the microprobe system of the BL8C can be used to obtain the distributions of trace elements and chemical and structural information of complex materials.

scholarly journals Modern Technologies for Examination of Three-Dimensional (3-D) Ultra-Fine Structure and Visualization of Microorganisms

2012 ◽  
pp. 29-34
Author(s):  
N. P. Konnov ◽  
Yu. P. Volkov ◽  
O. S. Kuznetsov
Keyword(s):  
Fine Structure ◽  
Functional Properties ◽  
Spatial Resolution ◽  
Biological Object ◽  
High Spatial Resolution ◽  
Three Dimensional ◽  
Review Of The Literature ◽  
Biological Objects ◽  
Modern Technologies

Outlined is a review of the literature data on the modern technologies for examination of the spatial (3-D) submicroscopic structural arrangement of biological objects with a high spatial resolution. Capacities of the instrumental visualization and analysis of a three-dimensional biological object significantly facilitate the overall characterization of its structural-functional properties.

Salyut-4 Observations of Active Regions on the Sun

1977 ◽  
Vol 36 ◽  
pp. 333-367 ◽  
Author(s):  
A.V. Bruns ◽  
G.M. Grechko ◽  
A.A. Gubarev ◽  
P.I. Klimuk ◽  
V.I. Sevastyanov ◽  
...  
Keyword(s):  
Fine Structure ◽  
Spatial Resolution ◽  
Physical State ◽  
High Spatial Resolution ◽  
Solar Spectrum ◽  
Active Regions ◽  
Spectral Lines ◽  
The Sun ◽  
Solar Image ◽  
Solar Plasma

We believe that the examination of the ultraviolet solar spectrum is the most informative tool for the diagnostic of the physical state of the solar plasma. But the well known phenomenon of fine structure of active regions (A.R.), as well as of quiet ones, making spectral lines to be wavy and patchy (across dispersion) demandsa) high spatial resolution on the solar image and b) stigmatic spectra.

High spatial resolution extended energy loss fine structure investigations of silicon dioxide compounds

1995 ◽  
Vol 59 (1-4) ◽  
pp. 149-157 ◽  
Author(s):  
Zou Wei Yuan ◽  
Stefan Csillag ◽  
Mohammad A. Tafreshi ◽  
Christian Colliex
Keyword(s):  
Fine Structure ◽  
Energy Loss ◽  
Silicon Dioxide ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Structure Investigations

scholarly journals Fine Structure of the Upper Chromosphere

1974 ◽  
Vol 56 ◽  
pp. 71-88
Author(s):  
J. T. Jefferies
Keyword(s):  
Fine Structure ◽  
Observational Data ◽  
Spatial Resolution ◽  
Recent Progress ◽  
High Spatial Resolution ◽  
Inhomogeneous Structure ◽  
Electromagnetic Spectrum ◽  
Solar Chromosphere ◽  
Euv Emission ◽  
Major Progress

The paper contains a review of attempts to understand observational data on the inhomogeneous structure of the upper solar chromosphere, particularly the spicules. Observations over the electromagnetic spectrum from millimetric to the ultraviolet give equivocal results; and in spite of recent progress, models for these inhomogeneous structures still face difficulties in accounting for the observed radiation. New observations in the visible are needed in order to answer even the simplest questions of kinematics, while the interpretation of the line spectra still poses many difficulties. The acquisition of EUV data at high spatial resolution should lead to major progress in the field, just as it already has done in showing the EUV emission to be concentrated over the network boundaries.

Insight Into the Properties of Functional Materials with Energy Filtered and Analytical TEM

2001 ◽  
Vol 7 (S2) ◽  
pp. 1156-1157
Author(s):  
G.A. Botton
Keyword(s):  
Fine Structure ◽  
Energy Loss ◽  
Spatial Resolution ◽  
Materials Science ◽  
High Spatial Resolution ◽  
Real Life ◽  
Analytical Techniques ◽  
Functional Materials ◽  
Magnetic Layers ◽  
High K Dielectric

Energy filtered (EF) imaging and energy loss fine structure analysis have now become routine tools to characterize very complex microstructures at high spatial resolution. When combined with energy dispersive x-ray spectroscopy microanalysis in a field emission gun transmission electron microscope (TEM) and with samples prepared by a large array of techniques such as FIB or microtoming, these analytical techniques can tackle real-life and more fundamental problems in materials science. This paper presents some examples of this work that highlight the complementarity of information obtained either from EF imaging, near-edge structures and EDS microanalysis. These examples are taken from work in the development of battery materials for automotive applications and in the study of ultrathin magnetic layers. Other examples of high spatial resolution energy loss fine structure at interfaces of high-K dielectric-Si in interface are shown in elsewhere in these proceedings.

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