PM-23Development of a 2000 K Class High Temperature Sample Holder for Transmission Electron Microscopy

Microscopy ◽  
2017 ◽  
Vol 66 (suppl_1) ◽  
pp. i29-i29
Author(s):  
Shogo Kikuchi ◽  
Manabu Tezura ◽  
Tomo-o Terasawa ◽  
Tokushi Kizuka
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Sample Holder ◽  
Transmission Electron ◽  
Temperature Sample

Effect of Coupled Conditions of Thermal Cycle and Dump Environment on Conductivity of 5mol% Yttria Stabilized Zirconia

2013 ◽  
Vol 591 ◽  
pp. 245-248 ◽  
Author(s):  
Jin Feng Xia ◽  
Hong Qiang Nian ◽  
Tao Feng ◽  
Hai Fang Xu ◽  
Dan Yu Jiang
Keyword(s):  
Electron Microscopy ◽  
Mechanical Properties ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Thermal Cycle ◽  
Oxygen Sensor ◽  
Yttria Stabilized Zirconia ◽  
Cyclic Change ◽  
Stabilized Zirconia ◽  
Transmission Electron

In some applications such as automotive oxygen sensor, 5mol% Y2O3stabilized zirconia (5YSZ) is generally used because it has both excellent ionic conductivity and mechanical properties. The automotive oxygen sensor would experience a cyclic change from high temperature (engine running) environment to the low temperature damp environment (in the tail pipe when vehicle stops). The conductivity change with coupled conditions of thermal cycle and dump environment in the 5mol%Y2O3ZrO2(5YSZ) system was examined by XRD,Impedance spectroscopy and transmission electron microscopy (SEM) in this paper.

In Situ High-Temperature Transmission Electron Microscopy Observations of the Formation of Nanocrystalline TiC from Nanocrystalline Anatase (TiO2)

1998 ◽  
Vol 4 (3) ◽  
pp. 269-277 ◽  
Author(s):  
A. Agrawal ◽  
J. Cizeron ◽  
V.L. Colvin
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Solid Phase ◽  
Anatase Phase ◽  
High Resolution Electron Microscopy ◽  
Rutile Phase ◽  
Transmission Electron ◽  
New Phase

In this work, the high-temperature behavior of nanocrystalline TiO2 is studied using in situ transmission electron microscopy (TEM). These nanoparticles are made using wet chemical techniques that generate the anatase phase of TiO2 with average grain sizes of 6 nm. X-ray diffraction studies of nanophase TiO2 indicate the material undergoes a solid-solid phase transformation to the stable rutile phase between 600° and 900°C. This phase transition is not observed in the TEM samples, which remain anatase up to temperatures as high as 1000°C. Above 1000°C, nanoparticles become mobile on the amorphous carbon grid and by 1300°C, all anatase diffraction is lost and larger (50 nm) single crystals of a new phase are present. This new phase is identified as TiC both from high-resolution electron microscopy after heat treatment and electron diffraction collected during in situ heating experiments. Video images of the particle motion in situ show the nanoparticles diffusing and interacting with the underlying grid material as the reaction from TiO2 to TiC proceeds.

Motion of Crystal/Crystal and Crystal/Amorphous Interfaces

1990 ◽  
Vol 183 ◽  
Author(s):  
J. L. Batstone
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Grain Boundary ◽  
Boundary Motion ◽  
High Temperature Annealing ◽  
Thermally Activated ◽  
Transmission Electron ◽  
Grain Boundary Motion

AbstractMotion of ordered twin/matrix interfaces in films of silicon on sapphire occurs during high temperature annealing. This process is shown to be thermally activated and is analogous to grain boundary motion. Motion of amorphous/crystalline interfaces occurs during recrystallization of CoSi2 and NiSi2 from the amorphous phase. In-situ transmission electron microscopy has revealed details of the growth kinetics and interfacial roughness.

scholarly journals Development of High-Temperature Solders: Contribution of Transmission Electron Microscopy

2015 ◽  
Vol 45 (2) ◽  
pp. 89-94 ◽  
Author(s):  
Jee-Hwan Bae ◽  
Keesam Shin ◽  
Joon-Hwan Lee ◽  
Mi-Yang Kim ◽  
Cheol-Woong Yang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Transmission Electron

scholarly journals Effect of Nb addition on high-temperature oxidation behavior, oxide layer structure, and its exfoliation resistance of Ti-Nb Alloys

2020 ◽  
Vol 321 ◽  
pp. 05018
Author(s):  
Eri Miura-Fujiwara ◽  
Yuya Ogawa ◽  
Mitsuo Niinomi ◽  
Tohru Yamasaki
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Oxide Layer ◽  
High Temperature Oxidation ◽  
Interfacial Microstructure ◽  
Temperature Oxidation ◽  
Transmission Electron ◽  
Cp Ti ◽  
Nb Addition

The authors proposed an oxide coating on Ti alloys for the dental abutment tooth, and they had reported that Ti–29Nb–13Ta–4.6Zr (TNTZ) alloy forms a dense oxide layer by high-temperature oxidation. On the other hand, CP Ti forms a multilayered oxide consisted of rutile monolayers and the void layer. This morphological change by alloying is supposed to be mainly caused by Nb addition in Ti since the dense oxide layer of TNTZ mainly consists of rutile TiO2 and TiNb2O7. Therefore, in this study, oxidation behaviors of various range of Nb content of Ti-xNb alloys (x = 1 ~ 32 mol%) were investigated, and exfoliation resistance was evaluated. And in this paper, the oxide/metal interfacial microstructure of oxidized CP Ti, TNTZ alloy, and Ti-Nb alloy was studied by a transmission electron microscopy (TEM) and by a scanning transmission electron microscopy with an electron dispersive spectroscopy (STEM-EDS). The cross-sectional observations suggested that the substrate was gradually oxidized during heat treatment, and nucleation and grain growth of TiO2 and TiNb2O7 proceed at the metal/oxide interface. Consequently, the gradual oxidation process in TNTZ and Ti-Nb alloys could lead to its continuous interfacial microstructure and dense oxide structure, which can achieve high exfoliation resistance.

scholarly journals Optimized High-Temperature In-Situ Transmission Electron Microscopy Double-Tilt Sample Heating Platform

2019 ◽  
Vol 25 (S2) ◽  
pp. 1540-1541
Author(s):  
Daan Hein Alsem ◽  
James Horwath ◽  
Julio Rodriguez-Manzo ◽  
Khim Karki ◽  
Eric Stach
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Sample Heating ◽  
Transmission Electron

scholarly journals High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy

2018 ◽  
Vol 148 ◽  
pp. 1-4 ◽  
Author(s):  
Gowtham Sriram Jawaharram ◽  
Patrick M. Price ◽  
Christopher M. Barr ◽  
Khalid Hattar ◽  
Robert S. Averback ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Transmission Electron ◽  
Temperature Irradiation
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