Atomic resolved phase map of monolayer MoS2retrieved by spherical aberration-corrected transport of intensity equation

Microscopy ◽  
2016 ◽  
Vol 65 (5) ◽  
pp. 422-428 ◽  
Author(s):  
Xiaobin Zhang ◽  
Yoshifumi Oshima
Keyword(s):  
Spherical Aberration ◽  
Transport Of Intensity Equation ◽  
Phase Map ◽  
Aberration Corrected

scholarly journals Transport of intensity equation method and its applications

Microscopy ◽  
2020 ◽  
Author(s):  
Masanori Mitome
Keyword(s):  
Phase Retrieval ◽  
Materials Science ◽  
Spherical Aberration ◽  
Image Resolution ◽  
Careful Attention ◽  
Magnetic Domains ◽  
Experimental Conditions ◽  
Retrieval Technique ◽  
Transport Of Intensity Equation ◽  
Phase Map

ABSTRACT A phase retrieval technique based on a transport of intensity equation (TIE) is one of the defocus series reconstruction techniques in microscopy. Since it does not require any dedicated devices like a biprism, and only three defocus images are enough to retrieve phase information, it has been applied to observe magnetic fields, magnetic domains, electrostatic potentials and strains. It is also used to improve image resolution by correcting spherical aberration. This technique is simple and easy to use, but some artifacts often appear in the retrieved phase map. One should pay careful attention to the experimental conditions and the algorithms and boundary conditions used to solve the TIE. This paper reviews the principle of the TIE method, the algorithms used to solve it and application results in materials science.

Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM images

2009 ◽  
Vol 110 (1) ◽  
pp. 36-42 ◽  
Author(s):  
Koji Kuramochi ◽  
Takashi Yamazaki ◽  
Yasutoshi Kotaka ◽  
Masahiro Ohtsuka ◽  
Iwao Hashimoto ◽  
...  
Keyword(s):  
Spherical Aberration ◽  
Chromatic Aberration ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

Nonlocality in spherical-aberration-corrected HAADF STEM images

2013 ◽  
Vol 69 (3) ◽  
pp. 289-296 ◽  
Author(s):  
Masahiro Ohtsuka ◽  
Takashi Yamazaki ◽  
Yasutoshi Kotaka ◽  
Hironori Fujisawa ◽  
Masaru Shimizu ◽  
...  
Keyword(s):  
Spherical Aberration ◽  
Aberration Corrected

Visualising alloy fluctuations by spherical-aberration–corrected HRTEM

2010 ◽  
Vol 91 (3) ◽  
pp. 36001 ◽  
Author(s):  
M. J. Casanove ◽  
N. Combe ◽  
F. Houdellier ◽  
M. J. Hÿtch
Keyword(s):  
Spherical Aberration ◽  
Aberration Corrected

scholarly journals Structural Analysis at an Atomic Scale Using Spherical Aberration Corrected Electron Microscope

2012 ◽  
Vol 54 (3) ◽  
pp. 159-165
Author(s):  
Yoshifumi OSHIMA ◽  
Yasumasa TANISHIRO ◽  
Takayuki TANAKA ◽  
Kunio TAKAYANAGI
Keyword(s):  
Electron Microscope ◽  
Structural Analysis ◽  
Spherical Aberration ◽  
Atomic Scale ◽  
Aberration Corrected

Development of Aberration-Corrected Electron Microscopy

2008 ◽  
Vol 14 (1) ◽  
pp. 2-15 ◽  
Author(s):  
David J. Smith
Keyword(s):  
Electron Microscopy ◽  
Spherical Aberration ◽  
Materials Characterization ◽  
Electron Holography ◽  
Aberration Correction ◽  
Future Prospects ◽  
Microscopy Image ◽  
Recent Developments ◽  
Fixed Beam ◽  
Aberration Corrected

The successful correction of spherical aberration is an exciting and revolutionary development for the whole field of electron microscopy. Image interpretability can be extended out to sub-Ångstrom levels, thereby creating many novel opportunities for materials characterization. Correction of lens aberrations involves either direct (online) hardware attachments in fixed-beam or scanning TEM or indirect (off-line) software processing using either off-axis electron holography or focal-series reconstruction. This review traces some of the important steps along the path to realizing aberration correction, including early attempts with hardware correctors, the development of online microscope control, and methods for accurate measurement of aberrations. Recent developments and some initial applications of aberration-corrected electron microscopy using these different approaches are surveyed. Finally, future prospects and problems are briefly discussed.

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