An autofocus method using quasi-Gaussian fitting of image sharpness in ultra-high-voltage electron microscopy

Microscopy ◽  
2013 ◽  
Vol 62 (5) ◽  
pp. 515-519 ◽  
Author(s):  
R. Nishi ◽  
Y. Moriyama ◽  
K. Yoshida ◽  
N. Kajimura ◽  
H. Mogaki ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Voltage ◽  
Image Sharpness ◽  
High Voltage Electron Microscopy ◽  
Gaussian Fitting ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Ultra High Voltage
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