scholarly journals Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy

Microscopy ◽  
2010 ◽  
Vol 59 (6) ◽  
pp. 457-461 ◽  
Author(s):  
Yoshifumi Oshima ◽  
Hidetaka Sawada ◽  
Fumio Hosokawa ◽  
Eiji Okunishi ◽  
Toshikatsu Kaneyama ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Spherical Aberration ◽  
Direct Imaging ◽  
Aberration Corrected

Development of Aberration-Corrected Electron Microscopy

2008 ◽  
Vol 14 (1) ◽  
pp. 2-15 ◽  
Author(s):  
David J. Smith
Keyword(s):  
Electron Microscopy ◽  
Spherical Aberration ◽  
Materials Characterization ◽  
Electron Holography ◽  
Aberration Correction ◽  
Future Prospects ◽  
Microscopy Image ◽  
Recent Developments ◽  
Fixed Beam ◽  
Aberration Corrected

The successful correction of spherical aberration is an exciting and revolutionary development for the whole field of electron microscopy. Image interpretability can be extended out to sub-Ångstrom levels, thereby creating many novel opportunities for materials characterization. Correction of lens aberrations involves either direct (online) hardware attachments in fixed-beam or scanning TEM or indirect (off-line) software processing using either off-axis electron holography or focal-series reconstruction. This review traces some of the important steps along the path to realizing aberration correction, including early attempts with hardware correctors, the development of online microscope control, and methods for accurate measurement of aberrations. Recent developments and some initial applications of aberration-corrected electron microscopy using these different approaches are surveyed. Finally, future prospects and problems are briefly discussed.

From Nanoparticles to Process: An Aberration-Corrected TEM Study of Fischer-Tropsch Catalysts at Various Steps of the Process

2011 ◽  
Vol 324 ◽  
pp. 197-200 ◽  
Author(s):  
Nadi Braidy ◽  
Carmen Andrei ◽  
Jasmin Blanchard ◽  
Nicolas Abatzoglou
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Amorphous Carbon ◽  
Spherical Aberration ◽  
Fischer Tropsch ◽  
Ft Synthesis ◽  
Transmission Electron ◽  
Treatment Step ◽  
Aberration Corrected

χThe nanostructure of Fischer-Tropsch (FT) Fe carbides are investigated using aberration-corrected high-resolution transmission electron microscopy (TEM). The plasma-generated Fe carbides are analyzed just after synthesis, following reduction via a H2 treatment step and once used as FT catalyst and deactivated. The as-produced nanoparticles (NPs) are seen to be abundantly covered with graphitic and amorphous carbon. Using the extended information limit from the spherical aberration-corrected TEM, the NPs could be indexed as a mixture of NPs in the θ-Fe3C and χ–Fe5C2 phases. The reduction treatment exposed the NPs by removing most of the carbonaceous speSubscript textcies while retaining the χ–Fe5C2. Fe-carbides NPs submitted to conditions typical to FT synthesis develop a Fe3O4 shell which eventually consumes the NPs up to a point where 3-4 nm residual carbide is left at the center of the particle. Subscript textVarious mechanisms explaining the formation of such a microstructure are discussed.

scholarly journals Atomic-Scale Characterization of Metals and Alloys Using Spherical-Aberration Corrected Scanning Transmission Electron Microscopy

2006 ◽  
Vol 12 (S02) ◽  
pp. 1344-1345
Author(s):  
D Williams ◽  
M Watanabe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Spherical Aberration ◽  
Atomic Scale ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Scale Characterization ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Fine structural features of nanoscale zero-valent iron characterized by spherical aberration corrected scanning transmission electron microscopy (Cs-STEM)

The Analyst ◽  
2014 ◽  
Vol 139 (18) ◽  
pp. 4512-4518 ◽  
Author(s):  
Airong Liu ◽  
Wei-xian Zhang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Spherical Aberration ◽  
Zero Valent Iron ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Nanoscale Zero Valent Iron ◽  
Scanning Transmission ◽  
Aberration Corrected

An angstrom-resolution physical model of nanoscale zero- valent iron (nZVI) is generated with a combination of spherical aberration corrected scanning transmission electron microscopy (Cs-STEM) and energy-dispersive X-ray spectroscopy (EDS).

Negative spherical aberration ultrahigh-resolution imaging in corrected transmission electron microscopy

2009 ◽  
Vol 367 (1903) ◽  
pp. 3735-3753 ◽  
Author(s):  
Knut W. Urban ◽  
Chun-Lin Jia ◽  
Lothar Houben ◽  
Markus Lentzen ◽  
Shao-Bo Mi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Phase Contrast ◽  
State Of The Art ◽  
Spherical Aberration ◽  
Transmission Electron ◽  
Resolution Imaging ◽  
Physical Background ◽  
Structure Of Matter ◽  
Aberration Corrected

Aberration-corrected transmission electron microscopy allows us to image the structure of matter at genuine atomic resolution. A prominent role for the imaging of crystalline samples is played by the negative spherical aberration imaging (NCSI) technique. The physical background of this technique is reviewed. The especially high contrast observed under these conditions owes its origin to an enhancing combination of amplitude contrast due to electron diffraction channelling and phase contrast. A number of examples of the application of NCSI are reviewed in order to illustrate the applicability and the state-of-the-art of this technique.

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