A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy
2004 ◽
Vol 53
(5)
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pp. 479-483
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2006 ◽
Vol 106
(11-12)
◽
pp. 1062-1068
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2011 ◽
Vol 174
(3)
◽
pp. 552-562
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