scholarly journals Introduction to ‘electron interference microscopy’

Microscopy ◽  
2020 ◽  
Author(s):  
Ken Harada ◽  
Tadahiro Kawasaki
Keyword(s):  
Interference Microscopy ◽  
Electron Interference

Electron holography for magnetic property study of materials

1990 ◽  
Vol 48 (4) ◽  
pp. 392-393
Author(s):  
Akira Tonomura
Keyword(s):  
Magnetic Field ◽  
Electron Beam ◽  
Phase Distribution ◽  
Magnetic Domain ◽  
Interference Microscopy ◽  
Electron Holography ◽  
Lorentz Microscopy ◽  
Coherent Field ◽  
Electron Interference ◽  
Intuitive Interpretation

An electron beam is often modulated, only in phase and not in intensity. When the beam passes through a magnetic field or a ferromagnetic thin film which can be regarded as pure phase objects. Therefore, great defocusing is indispensable for magnetic domain observation in Lorentz microscopy. Electron interference microscopy, however, can directly display the phase distribution of an electron beam in an in-focus electron micrograph, and consequently should provide direct information about magnetic fields.The development of a coherent field emission electron beam has opened a way to such a possibility using electron holography in which the phase-amplified phase distribution can be displayed as an interference micrograph. In addition, contour fringes have been interpreted as in-plane magnetic lines of force. Such an intuitive interpretation is possible for the following reason (Fig.1). An incident wavefront is displaced by the vector potential circulating around a magnetic field.

Phase contrast and interference microscopy with the electron microscope

1971 ◽  
Vol 261 (837) ◽  
pp. 95-104 ◽  
Keyword(s):  
Electron Microscope ◽  
Phase Contrast ◽  
Carbon Film ◽  
Optical Diffraction ◽  
Interference Microscopy ◽  
Phase Plate ◽  
Bright Field ◽  
Thin Carbon ◽  
Thin Carbon Film ◽  
Electron Interference

A simple electrostatic device has been constructed which, when inserted in the optical system of an electron microscope, functions as an absorbing phase plate. Its operation depends on the central portion of a thin poorly conducting thread generating a stable potential under the influence of the electron beam and creating a particular form of electric field. An electron interference technique is employed to study the stabilizing mechanism and to develop a method for achieving the required magnitude of potential. The performance of this device is gauged by optical diffraction of electron micrographs of a thin carbon film; its application is illustrated by examining some negatively stained biological specimens. The results indicate that such an ‘electrostatic phase plate’ can provide significant improvements in contrast and signal/noise ratio over normal bright field images without loss in resolution.

Flux Line Dynamics with Electron Holography

1994 ◽  
Vol 332 ◽  
Author(s):  
Akira Tonomura
Keyword(s):  
Flux Line ◽  
Interference Microscopy ◽  
Electron Holography ◽  
Temperature Changes ◽  
Lorentz Microscopy ◽  
Flux Lines ◽  
Electron Interference ◽  
Time Observation ◽  
Real Time Observation ◽  
Line Movement

ABSTRACTFlux lines in superconducting thin films are observed statically in a holographic electron interference micrograph, and dynamically in a Lorentz micrograph with a “coherent” and 300kV electron beam. In interference microscopy, projected magnetic lines of force in a tilted Nb thin film are observed quantitatively as contour fringes drawn on an in-focus electron micrograph. Whereas in Lorentz microscopy, flux lines are observed as spots with bright and dark contrast pairs due to defocusing of the image. Although the image is blurred due to a large amount of defocusing, this method is suitable for real-time observation. By making the best use of this feature, flux line movement can be observed when the applied magnetic field or the film temperature changes.

Scanning Electron Microscopy and Electron Microprobe Analysis of Malignant Cell Cultures

1968 ◽  
Vol 26 ◽  
pp. 164-165
Author(s):  
R. I. Johnsson-Hegyeli ◽  
A. F. Hegyeli ◽  
D. K. Landstrom ◽  
W. C. Lane
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Cell Cultures ◽  
Electron Microprobe ◽  
Microprobe Analysis ◽  
Electron Microprobe Analysis ◽  
Three Dimensional ◽  
Malignant Cell ◽  
Interference Microscopy ◽  
Scanning Electron

Last year we reported on the use of reflected light interference microscopy (RLIM) for the direct color photography of the surfaces of living normal and malignant cell cultures without the use of replicas, fixatives, or stains. The surface topography of living cells was found to follow underlying cellular structures such as nuceloli, nuclear membranes, and cytoplasmic organelles, making possible the study of their three-dimensional relationships in time. The technique makes possible the direct examination of cells grown on opaque as well as transparent surfaces. The successful in situ electron microprobe analysis of the elemental composition and distribution within single tissue culture cells was also reported.This paper deals with the parallel and combined use of scanning electron microscopy (SEM) and the two previous techniques in a study of living and fixed cancer cells. All three studies can be carried out consecutively on the same experimental specimens without disturbing the cells or their structural relationships to each other and the surface on which they are grown. KB carcinoma cells were grown on glass coverslips in closed Leighto tubes as previously described. The cultures were photographed alive by means of RLIM, then fixed with a fixative modified from Sabatini, et al (1963).

scholarly journals Monitoring Reactivation of Latent HIV by Label-Free Gradient Light Interference Microscopy

iScience ◽  
2021 ◽  
pp. 102940
Author(s):  
Neha Goswami ◽  
Yiyang Lu ◽  
Mikhail E. Kandel ◽  
Michael J. Fanous ◽  
Kathrin Bohn-Wippert ◽  
...  
Keyword(s):  
Interference Microscopy ◽  
Label Free ◽  
Light Interference ◽  
Latent Hiv

3-D Optical Interference Microscopy at the Lateral Resolution

2014 ◽  
Vol 8 (4) ◽  
pp. 231-241 ◽  
Author(s):  
Peter Lehmann ◽  
Jan Niehues ◽  
Stanislav Tereschenko
Keyword(s):  
Interference Microscopy ◽  
Lateral Resolution ◽  
Optical Interference

Phase-modulation laser interference microscopy: an advance in cell imaging and dynamics study

2008 ◽  
Vol 13 (3) ◽  
pp. 034004 ◽  
Author(s):  
Alexey R. Brazhe ◽  
Nadezda A. Brazhe ◽  
Georgy V. Maksimov ◽  
Pavel S. Ignatyev ◽  
Andrey B. Rubin ◽  
...  
Keyword(s):  
Phase Modulation ◽  
Cell Imaging ◽  
Interference Microscopy ◽  
Laser Interference ◽  
Laser Interference Microscopy
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