Pseudoparticle Multipole Method: A Simple Method to Implement a High-Accuracy Tree Code

2001 ◽  
Vol 550 (2) ◽  
pp. L143-L146 ◽  
Author(s):  
Atsushi Kawai ◽  
Junichiro Makino
Acta Numerica ◽  
1997 ◽  
Vol 6 ◽  
pp. 229-269 ◽  
Author(s):  
Leslie Greengard ◽  
Vladimir Rokhlin

We introduce a new version of the Fast Multipole Method for the evaluation of potential fields in three dimensions. It is based on a new diagonal form for translation operators and yields high accuracy at a reasonable cost.


2002 ◽  
Vol 8 (S02) ◽  
pp. 438-439
Author(s):  
J. T. Armstrong ◽  
R. B. Marinenko ◽  
J. M. Davis

2014 ◽  
Vol 6 (13) ◽  
pp. 4585-4592 ◽  
Author(s):  
Bin Liu ◽  
Wei Wang ◽  
Chen Li ◽  
Chunyi Tong ◽  
Ying Long

A fluorescence method with wide promising applications was developed for VEGF mRNA assay with high accuracy and specificity by applying dual molecular beacons as probes.


2003 ◽  
Vol 208 ◽  
pp. 305-314 ◽  
Author(s):  
Atsushi Kawai ◽  
Junichiro Makino

We invented the pseudoparticle multipole method (P2M2), a method to express multipole expansion by a distribution of pseudoparticles. We can use this distribution of particles to calculate high order terms in both the Barnes-Hut treecode and FMM. The primary advantage of P2M2 is that it works on GRAPE. Although the treecode has been implemented on GRAPE, we could handle terms only up to dipole, since GRAPE can calculate forces from point-mass particles only. Thus the calculation cost grows quickly when high accuracy is required. With P2M2, the multipole expansion is expressed by particles, and thus GRAPE can calculate high order terms. Using P2M2, we realized arbitrary-order treecode on MDGRAPE-2. Timing result shows MDGRAPE-2 accelerates the calculation by a factor between 20 (for low accuracy) to 150 (for high accuracy). We parallelized the code so that it runs on MDGRAPE-2 cluster. The calculation speed of the code shows close-to-linear scaling up to 16 processors for N ≳ 106.


1943 ◽  
Vol 16 (2) ◽  
pp. 388-399 ◽  
Author(s):  
J. W. Van Dalfsen

Abstract In connection with a study of various kinds of vulcanized rubber, including rubber films from vulcanized latex and latex films vulcanized in the dry state, it seemed desirable to investigate the packing of the latex particles. To what extent, for example, are these still present or are they coalesced? It is known that the diffusion of water vapor through solid substances may give an indication of the internal structure of matter. With this in mind, a search was made for a simple method to determine the diffusion of water vapor through rubber; high accuracy was not required so much as were simplicity and adaptability to a long series of experiments. Such a procedure was found in the method described by Hoekstra for determining the permeability of varnish films to water vapor. A detailed description of the method is given later in this paper. More accurate methods of determination, applied to rubber, have previously been described by others, but these procedures are less suitable for systematic tests.


2019 ◽  
Vol 889 ◽  
pp. 469-474
Author(s):  
Trung Kien Hoang ◽  
Nguyen Minh Duc Ta

Computer numerical control (CNC) machine tool plays an extremely significant role in any manufacturing industry due to its automation and high accuracy. Keeping the CNC machine tool at its highest performance to meet the demand of high accuracy machining is always significant. To maintain the accuracy of a machine tool over the time, it is important to measure and compensate the geometric error, one of the main error source of machine tool, especially when the machine get old. There are totally 21 geometrical errors in a 3-axis machine tool including three translational errors and three rotational errors for each axis and three perpendicular error (Squareness) within three axes of the machine. This paper presents an economical and simple method for measuring the geometric error of a 3-axis CNC machine tool based on the machining of actual samples. Three samples for each axis will be machined following a design cutting path. The samples will then be measured using a coordinate measuring machine (CMM). The collect data will be used for estimating the geometric errors. The volumetric errors will be then computed and verified through machining of 3D geometries.


2021 ◽  
Vol 21 (11) ◽  
pp. 283
Author(s):  
Li-Si Chen ◽  
Zhong-Wen Hu ◽  
Hai-Jiao Jiang ◽  
Hui-Min Kang ◽  
Chen-Zhong Wang

Abstract A simple method for measuring grating groove density as well as its position and orientation is proposed based on the idea of ERT (Experimental Ray Tracing). Conventional methods only measure grating groove density with accuracy limited by its rotary stage and goniometer. The method proposed in the paper utilizes linear guides which could be calibrated to much higher accuracy. It is applicable to gratings of arbitrary surface profile or mosaic of a group of various gratings. Various measurement error sources are simulated by the Monte Carlo method and the results show high accuracy capability of grating parameters identification. A verification testing is performed. The accuracy dependency on main configuration parameters is evaluated. A method to expand measurement range by double wavelength is also discussed.


Author(s):  
Avi Karsenty ◽  
Shmuel Feldman ◽  
Zvi Veig ◽  
Yoel Arieli

This article describes a new approach for performing full field imaging ellipsometry. In this new technique, the objective lens of a high numerical aperture microscope is used to illuminate the surface of a 2D object. The light reflected from each point of the surface is gathered by the same lens and projected onto a 2D CCD detectors array; thus, enabling the measurement of numerous surface points simultaneously. Using this simple method, areas of up to 0.9 cm2 can be measured with high accuracy. Since the nanotechnology domain is rapidly growing, such a technique can bring benefits to the scientific community, facing the need to analyze large surfaces of thin films.


2010 ◽  
Vol 81 (6) ◽  
pp. 065105 ◽  
Author(s):  
Yi-Lin Hung ◽  
Yao-Yuan Chang ◽  
Meng-Jiy Wang ◽  
Shi-Yow Lin

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