Theoretical Study of the Spatially Resolved Soft X‐Ray versus Hard X‐Ray Relationship in Solar Flares

1997 ◽  
Vol 491 (1) ◽  
pp. 395-401 ◽  
Author(s):  
Peng Li ◽  
James M. McTiernan ◽  
A. Gordon Emslie
Keyword(s):  
Solar Flares ◽  
Theoretical Study ◽  
X Ray ◽  
Spatially Resolved

scholarly journals Flares on the Sun: Selected Results from SMM

1983 ◽  
Vol 71 ◽  
pp. 289-305
Author(s):  
G.M. Simnett
Keyword(s):  
Solar Flares ◽  
Solar Maximum ◽  
Electromagnetic Spectrum ◽  
Significant Progress ◽  
X Ray ◽  
Spatially Resolved ◽  
Red Dwarfs ◽  
Important Diagnostic Tool ◽  
Flare Stars ◽  
Made In

Observationally the study of solar flares has reached the stage where intensity-time distributions of emission over broad and resolved regions of the electromagnetic spectrum are obtained for spatially resolved parts of the flare. Polarization measurements add an important diagnostic tool in some wavebands but we shall not report on these here. In the optical band good ground based observations have been available for many years, whereas in the UV, soft X-ray and hard X-ray (> 5 keV) bands recent spacecraft have greatly extended the data base. Good high resolution maps are being made in the microwave region with the ground based VIA. We are now at the point where significant progress into understanding the flare problem has been made, and will continue to be made, during the current solar maximum. This coincides with the development of soft X-ray instruments sensitive enough to detect transient and quiescent emission from flare stars, particularly red dwarfs in the solar neighbourhood (e.g. Kahn et al,1979, Haisch et al, 1980) which previously had only been detected in the optical and radio wavebands.

Layered and ion implantation specimens as possible reference materials for the electron-probe microanalysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1652-1653
Author(s):  
G. Remond ◽  
R.H. Packwood ◽  
C. Gilles ◽  
S. Chryssoulis
Keyword(s):  
Ion Implantation ◽  
Reference Materials ◽  
Analytical Techniques ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
X Ray ◽  
Spatially Resolved ◽  
Analytical Expressions ◽  
Original Approach ◽  
Depth Concentration

Merits and limitations of layered and ion implanted specimens as possible reference materials to calibrate spatially resolved analytical techniques are discussed and illustrated for the case of gold analysis in minerals by means of x-ray spectrometry with the EPMA. To overcome the random heterogeneities of minerals, thin film deposition and ion implantation may offer an original approach to the manufacture of controlled concentration/ distribution reference materials for quantification of trace elements with the same matrix as the unknown.In order to evaluate the accuracy of data obtained by EPMA we have compared measured and calculated x-ray intensities for homogeneous and heterogeneous specimens. Au Lα and Au Mα x-ray intensities were recorded at various electron beam energies, and hence at various sampling depths, for gold coated and gold implanted specimens. X-ray intensity calculations are based on the use of analytical expressions for both the depth ionization Φ (ρz) and the depth concentration C (ρz) distributions respectively.

The occurrence of single hard x-ray sources in solar flares

2003 ◽  
Vol 32 (12) ◽  
pp. 2483-2488
Author(s):  
C GOFF ◽  
S MATTHEWS ◽  
L HARRA
Keyword(s):  
Solar Flares ◽  
X Ray

scholarly journals Sample Environment for Operando Hard X-ray Tomography—An Enabling Technology for Multimodal Characterization in Heterogeneous Catalysis

Catalysts ◽  
2021 ◽  
Vol 11 (4) ◽  
pp. 459
Author(s):  
Johannes Becher ◽  
Sebastian Weber ◽  
Dario Ferreira Sanchez ◽  
Dmitry E. Doronkin ◽  
Jan Garrevoet ◽  
...  
Keyword(s):  
Heterogeneous Catalysis ◽  
Synchrotron Radiation ◽  
Contrast Imaging ◽  
Co2 Methanation ◽  
Full Field ◽  
X Ray ◽  
Spatially Resolved ◽  
Oxidation Of Methane ◽  
Unique Source ◽  
Sample Environment

Structure–activity relations in heterogeneous catalysis can be revealed through in situ and operando measurements of catalysts in their active state. While hard X-ray tomography is an ideal method for non-invasive, multimodal 3D structural characterization on the micron to nm scale, performing tomography under controlled gas and temperature conditions is challenging. Here, we present a flexible sample environment for operando hard X-ray tomography at synchrotron radiation sources. The setup features are discussed, with demonstrations of operando powder X-ray diffraction tomography (XRD-CT) and energy-dispersive tomographic X-ray absorption spectroscopy (ED-XAS-CT). Catalysts for CO2 methanation and partial oxidation of methane are shown as case studies. The setup can be adapted for different hard X-ray microscopy, spectroscopy, or scattering synchrotron radiation beamlines, is compatible with absorption, diffraction, fluorescence, and phase-contrast imaging, and can operate with scanning focused beam or full-field acquisition mode. We present an accessible methodology for operando hard X-ray tomography studies, which offer a unique source of 3D spatially resolved characterization data unavailable to contemporary methods.

Statistical analysis of soft X-ray solar flares during solar cycles 22, 23, and 24

2021 ◽  
Vol 366 (1) ◽  
Author(s):  
Bo Xiong ◽  
Ting Wang ◽  
Xiaolin Li ◽  
Yunxing Yin
Keyword(s):  
Statistical Analysis ◽  
Solar Flares ◽  
Solar Cycles ◽  
X Ray

scholarly journals Spatially Resolved Forming Mechanisms Detection in Single Point Incremental Forming Using Synchrotron Based Texture Analysis

2021 ◽  
Author(s):  
Mateus Dobecki ◽  
Alexander Poeche ◽  
Walter Reimers
Keyword(s):  
Texture Analysis ◽  
Incremental Forming ◽  
Single Point ◽  
High Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Forming Mechanism ◽  
Spatially Resolved ◽  
Step Down ◽  
Stress States

AbstractDespite the ongoing success of understanding the deformation states in sheets manufactured by single-point incremental forming (SPIF), the unawareness of the spatially resolved influence of the forming mechanisms on the residual stress states of incrementally formed sheet metal parts impedes their application-optimized use. In this study, a well-founded experimental proof of the occurring forming mechanisms shear, bending and stretching is presented using spatially resolved, high-energy synchrotron x-ray diffraction-based texture analysis in transmission mode. The measuring method allows even near-surface areas to be examined without any impairment of microstructural influences due to tribological reactions. The depth-resolved texture evolution for different sets of forming parameters offers insights into the forming mechanisms acting in SPIF. Therefore, the forming mechanisms are triggered explicitly by adjusting the vertical step-down increment Δz for groove, plate and truncated cone geometries. The texture analysis reveals that the process parameters and the specimen geometries used lead to characteristic changes in the crystallites’ orientation distribution in the formed parts due to plastic deformation. These forming-induced reorientations of the crystallites could be assigned to the forming mechanisms by means of defined reference states. It was found that for groove, plate and truncated cone geometries, a decreasing magnitude of step-down increments leads to a more pronounced shear deformation, which causes an increasing work hardening especially at the tool contact area of the formed parts. Larger step-down increments, on the other hand, induce a greater bending deformation. The plastic deformation by bending leads to a complex stress field that involves alternating residual tensile stresses on the tool and residual compressive stresses on the tool-averted side incrementally formed sheets. The present study demonstrates the potential of high-energy synchrotron x-ray diffraction for the spatially resolved forming mechanism research in SPIF. Controlling the residual stress states by optimizing the process parameters necessitates knowledge of the fundamental forming mechanism action.

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