Electrical and Thermal Conductivities of Dense Matter in the Crystalline Lattice Phase. III. Inclusion of Lower Densities: Erratum

1994 ◽  
Vol 436 ◽  
pp. 418 ◽  
Author(s):  
Noaki Itoh ◽  
Hiroshi Hayashi ◽  
Yasuharu Kohyama
1984 ◽  
Vol 285 ◽  
pp. 758 ◽  
Author(s):  
N. Itoh ◽  
Y. Kohyama ◽  
N. Matsumoto ◽  
M. Seki

1994 ◽  
Vol 147 ◽  
pp. 394-419
Author(s):  
Naoki Itoh

AbstractTransport processes in dense stellar plasmas which are relevant to the interiors of white dwarfs and neutron stars are reviewed. The emphasis is placed on the accuracy of the numerical results. In this review we report on the electrical conductivity and the thermal conductivity of dense matter. The methods of the calculations are different for the liquid metal phase and the crystalline lattice phase. We will broadly review the current status of the calculations of the transport properties of dense matter, and try to give the best instructions available at the present time to the readers.


2008 ◽  
Vol 677 (1) ◽  
pp. 495-502 ◽  
Author(s):  
Naoki Itoh ◽  
Shinsuke Uchida ◽  
Yu Sakamoto ◽  
Yasuharu Kohyama ◽  
Satoshi Nozawa

Author(s):  
W. D. Cooper ◽  
C. S. Hartley ◽  
J. J. Hren

Interpretation of electron microscope images of crystalline lattice defects can be greatly aided by computer simulation of theoretical contrast from continuum models of such defects in thin foils. Several computer programs exist at the present time, but none are sufficiently general to permit their use as an aid in the identification of the range of defect types encountered in electron microscopy. This paper presents progress in the development of a more general computer program for this purpose which eliminates a number of restrictions contained in other programs. In particular, the program permits a variety of foil geometries and defect types to be simulated.The conventional approximation of non-interacting columns is employed for evaluation of the two-beam dynamical scattering equations by a piecewise solution of the Howie-Whelan equations.


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