C IV line profile correlations in NGC 4151

1991 ◽  
Vol 371 ◽  
pp. 136 ◽  
Author(s):  
R. P. Fahey ◽  
A. G. Michalitsianos ◽  
D. Kazanas
Keyword(s):  
Line Profile ◽  
Ngc 4151

The Broad F[CLC]e[/CLC] K-Line Profile in NGC 4151

1999 ◽  
Vol 523 (2) ◽  
pp. L129-L132 ◽  
Author(s):  
Jun-Xian Wang ◽  
You-Yuan Zhou ◽  
Ting-Gui Wang
Keyword(s):  
Line Profile ◽  
Ngc 4151

A detailed study of the CIV 1550 line profile and adjacent spectral features in NGC 4151 from 1978 up to 1983

1986 ◽  
Vol 119 ◽  
pp. 351-352
Author(s):  
J. Clavel ◽  
A. Altamore ◽  
A. Boksenberg ◽  
G.E. Bromage ◽  
A. Elvius ◽  
...  
Keyword(s):  
Emission Line ◽  
Line Profile ◽  
Seyfert Galaxy ◽  
Spectral Features ◽  
Continuum Source ◽  
Ngc 4151 ◽  
The Continuum

Fitting technics are applied to study the variations of the 1550 line profile and adjacent features in the IUE spectrum of the Seyfert galaxy NGC 4151, from 1978 up to 1983. New important results are found concerning the kinematics and physics of the emission line gas at a few light-days from the continuum source.

A Detailed Study of the CIV 1550 Line Profile and Adjacent Spectral Features in NGC 4151 from 1978 up to 1983

Quasars ◽  
1986 ◽  
pp. 351-352
Author(s):  
J. Clavel ◽  
A. Altamore ◽  
A. Boksenberg ◽  
G. E. Bromage ◽  
A. Elvius ◽  
...  
Keyword(s):  
Line Profile ◽  
Spectral Features ◽  
Ngc 4151

scholarly journals The Mg II line profile in the Seyfert galaxy NGC 4151: a new outflowing component

1987 ◽  
Vol 225 (4) ◽  
pp. 837-849 ◽  
Author(s):  
K. J. Leech ◽  
M. V. Penston ◽  
M. A. J. Snijders ◽  
T. R. Gull
Keyword(s):  
Line Profile ◽  
Seyfert Galaxy ◽  
Ngc 4151

A detailed study of the C IV 1550-A line profile and adjacent spectral features in NGC 4151 from 1978 to 1983

1987 ◽  
Vol 321 ◽  
pp. 251 ◽  
Author(s):  
J. Clavel ◽  
A. Altamore ◽  
A. Boksenberg ◽  
G. E. Bromage ◽  
A. Elvius ◽  
...  
Keyword(s):  
Line Profile ◽  
Spectral Features ◽  
Ngc 4151

The Iron Kα Line Profile in NGC 4151

1995 ◽  
Vol 453 (2) ◽  
Author(s):  
T. Yaqoob, ◽  
R. Edelson, ◽  
K. A. Weaver, ◽  
R. S. Warwick, ◽  
R. F. Mushotzky, ◽  
...  
Keyword(s):  
Line Profile ◽  
Ngc 4151

Contrast of Filament Bright Rims

1994 ◽  
Vol 144 ◽  
pp. 365-367
Author(s):  
E. V. Kononovich ◽  
O. B. Smirnova ◽  
P. Heinzel ◽  
P. Kotrč
Keyword(s):  
High Altitude ◽  
Line Profile ◽  
Line Center ◽  
Magnetic Structures ◽  
The Mean

AbstractThe Hα filtergrams obtained at Tjan-Shan High Altitude Observatory near Alma-Ata (Moscow University Station) were measured in order to specify the bright rims contrast at different points along the line profile (0.0; ± 0.25; ± 0.5; ± 0.75 and ± 1.0 Å). The mean contrast value in the line center is about 25 percent. The bright rims interpretation as the bases of magnetic structures supporting the filaments is suggested.

Frequency Redistribution Effects in the Formation of Lyman α in Prominences and Their Influence on the Ratio of Hα to Lα

1979 ◽  
Vol 44 ◽  
pp. 53-55
Author(s):  
R.W. Milkey ◽  
J.N. Heasley ◽  
E.J. Schmahl ◽  
O. Engvold
Keyword(s):  
Line Profile ◽  
Large Fraction ◽  
Partial Frequency ◽  
Frequency Redistribution ◽  
Partial Frequency Redistribution ◽  
Emergent Intensity

The effect of partial frequency redistribution in the formation of Lyman α in the chromosphere has been discussed by Milkey and Mihalas (1973) and others, and it has been shown that in this case the coherency of scattering in the wings of the line substantially influences the line profile. Although there are non-negligible sources for La photons within a prominence, a large fraction of the emergent line photons are due to scattering of photons incident on the surface of the prominence so that one expects that in a prominence the frequency redistribution processes will play an important role in determining the emergent intensity.

Microstructure of post-deformed ECAP-Ti investigated by Multiple X-Ray Line Profile Analysis

2006 ◽  
Vol 2006 (suppl_23_2006) ◽  
pp. 129-134 ◽  
Author(s):  
E. Schafler ◽  
K. Nyilas ◽  
S. Bernstorff ◽  
L. Zeipper ◽  
M. Zehetbauer ◽  
...  
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray
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