Determining the Speed of a Camera Shutter by a Thermoelectric Method

1942 ◽  
Vol 54 ◽  
pp. 37
Author(s):  
Edison Pettit
2005 ◽  
Vol 38 (21) ◽  
pp. 3985-3990
Author(s):  
M Pattabiraman ◽  
R Nagendran ◽  
D K Baisnab ◽  
M P Janawadkar ◽  
Y Hariharan

2010 ◽  
Vol 24 (12) ◽  
pp. 2511-2517 ◽  
Author(s):  
Jihun Kim ◽  
Kyung Ho Sun ◽  
Woochul Kim ◽  
Jae Eun Kim

2016 ◽  
Vol 12 (S325) ◽  
pp. 55-58
Author(s):  
David Borncamp ◽  
Norman Grogin ◽  
Matthew Bourque ◽  
Sara Ogaz

AbstractExcess thermal energy within a Charged Coupled Device (CCD) results in excess electrical current that is trapped within the lattice structure of the electronics. This excess signal from the CCD itself can be present through multiple exposures, which will have an adverse effect on its science performance unless it is corrected for. The traditional way to correct for this extra charge is to take occasional long-exposure images with the camera shutter closed. These images, generally referred to as “dark” images, allow for the measurement of thermal-electron contamination at each pixel of the CCD. This so-called “dark current” can then be subtracted from the science images by re-scaling to the science exposure times. Pixels that have signal above a certain value are traditionally marked as “hot” and flagged in the data quality array. Many users will discard these pixels as being bad. However, these pixels may not be bad in the sense that they cannot be reliably dark-subtracted; if these pixels are shown to be stable over a given anneal period, the charge can be properly subtracted and the extra Poisson noise from this dark current can be taken into account and put into the error arrays.


1959 ◽  
Vol 2 (11) ◽  
pp. 889-890
Author(s):  
I. N. Osher ◽  
I. I. Bobkovskaya

2008 ◽  
Vol 2008 (0) ◽  
pp. _466-1_-_466-5_
Author(s):  
Hidekazu KANDO ◽  
Hiroki MATSUMOTO ◽  
Ken-ichi SAITOH ◽  
Kenji ISHIKAWA ◽  
Shuhei TANEDA

2020 ◽  
Vol 87 (9) ◽  
pp. 527
Author(s):  
B. Zhao ◽  
W. Liang ◽  
E. H. Liu ◽  
R. K. Jiang

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