ELECTRON MICROSCOPIC OBSERVATION OF SPECIMENS UNDER CONTROLLED GAS PRESSURE
1962 ◽
Vol 13
(1)
◽
pp. 147-152
◽
Keyword(s):
A technique for encasing specimens in a thin gas layer during their observation in the Siemens Elmiskop I is described. All gases can be employed at pressures up to one atmosphere. Destruction of specimens can occur in the beam; all organic specimens are particularly liable to decompose. The conditions under which this can be avoided are given. A useful application of the technique allows one to prevent specimens from drying out, as they normally do in vacuum. A further application uses the controlled removal of carbon for thinning organic layers and for selective etching of organic materials.
1982 ◽
Vol 40
◽
pp. 680-681
2020 ◽
Vol 66
(2)
◽
pp. 106-115
◽
1990 ◽
Vol 1023
(3)
◽
pp. 335-340
◽
1982 ◽
Vol 11
(4)
◽
pp. 315-322
1987 ◽
Vol 16
(1)
◽
pp. 71-77
◽
1986 ◽
Vol 82
(2)
◽
pp. 527
◽
1966 ◽
Vol 5
(7)
◽
pp. 603-607
◽