A Novel Approach to Rapid Determination of βS‐Globin Haplotypes: Sequencing of theAγ‐IVS‐II Region

Hemoglobin ◽  
2004 ◽  
Vol 28 (4) ◽  
pp. 317-323
Author(s):  
Amy E. Vinson ◽  
Aisha Walker ◽  
Dedrey Elam ◽  
Michele Glendenning ◽  
Ferdane Kutlar ◽  
...  
Keyword(s):  
Rapid Determination ◽  
Novel Approach

A novel approach to the rapid determination of amoxicillin in human plasma by solid phase microextraction and liquid chromatography

The Analyst ◽  
2011 ◽  
Vol 136 (12) ◽  
pp. 2635 ◽  
Author(s):  
Boguslaw Buszewski ◽  
Malgorzata Szultka ◽  
Pawel Olszowy ◽  
Szymon Bocian ◽  
Tomasz Ligor
Keyword(s):  
Liquid Chromatography ◽  
Human Plasma ◽  
Solid Phase Microextraction ◽  
Solid Phase ◽  
Rapid Determination ◽  
Novel Approach

A novel approach for rapid determination of vitamin B12 in pharmaceutical preparations using BSA-modified gold nanoclusters

2012 ◽  
Vol 4 (12) ◽  
pp. 4155 ◽  
Author(s):  
Fayezeh Samari ◽  
Bahram Hemmateenejad ◽  
Zahra Rezaei ◽  
Mojtaba Shamsipur
Keyword(s):  
Vitamin B12 ◽  
Rapid Determination ◽  
Gold Nanoclusters ◽  
Pharmaceutical Preparations ◽  
Novel Approach

Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

1976 ◽  
Vol 34 ◽  
pp. 590-591
Author(s):  
T. Y. Tan ◽  
W. K. Tice
Keyword(s):  
Fast Neutron ◽  
Rapid Determination ◽  
Stacking Faults ◽  
Imaging Method ◽  
Large Reduction ◽  
Dislocation Loops ◽  
Fringe Spacing ◽  
Weak Beam ◽  
Kinematical Theory

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.

Methods for rapid determination of pecan (Carya illinoensis) seed viability

2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu
Keyword(s):  
Rapid Determination ◽  
Seed Viability ◽  
Carya Illinoensis

The Use of TMAH to Etch Silicon and Expose Metal Bridging Failures

2000 ◽  
Author(s):  
Mark Morris ◽  
James Mohr ◽  
Esteban Ortiz ◽  
Steven Englebretson
Keyword(s):  
Failure Mechanism ◽  
Schottky Diodes ◽  
Tetramethylammonium Hydroxide ◽  
Novel Approach ◽  
Failure Location ◽  
Metal Etching ◽  
Plastic Mold

Abstract Determination of metal bridging failures on plastic encapsulated devices is difficult due to the metal etching effects that occur while removing many of the plastic mold compounds. Typically, the acids used to remove the encapsulation are corrosive to the metals that are found within the device. Thus, decapsulation can result in removal of the failure mechanism. Mechanical techniques are often not successful due to damage that results in destruction of the die and failure mechanism. This paper discusses a novel approach to these types of failures using a silicon etch and a backside evaluation. The desirable characteristics of the technique would be to remove the silicon and leave typical device metals unaffected. It would also be preferable that the device passivation and oxides not be etched so that the failure location is not disturbed. The use of Tetramethylammonium Hydroxide (TMAH), was found to fit these prerequisites. The technique was tested on clip attached Schottky diodes that exhibited resistive shorting. The use of the TMAH technique was successful at exposing thin solder bridges that extruded over the edge of the die resulting in failure.

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