A Depolarization Criterion in Mueller Matrices

1985 ◽  
Vol 32 (3) ◽  
pp. 259-261 ◽  
Author(s):  
José Jorge Gil ◽  
Eusebio Bernabeu
Keyword(s):  
Mueller Matrices

The Impact of Light Polarisation on Light Field of Scenes with Multiple Reflections

2020 ◽  
pp. 108-115 ◽  
Author(s):  
Vladimir P. Budak ◽  
Anton V. Grimaylo
Keyword(s):  
Mathematical Model ◽  
Light Field ◽  
Global Illumination ◽  
Multiple Reflections ◽  
Software Environment ◽  
The Monte Carlo Method ◽  
Mueller Matrices ◽  
Volume Integration ◽  
The Impact

The article describes the role of polarisation in calculation of multiple reflections. A mathematical model of multiple reflections based on the Stokes vector for beam description and Mueller matrices for description of surface properties is presented. On the basis of this model, the global illumination equation is generalised for the polarisation case and is resolved into volume integration. This allows us to obtain an expression for the Monte Carlo method local estimates and to use them for evaluation of light distribution in the scene with consideration of polarisation. The obtained mathematical model was implemented in the software environment using the example of a scene with its surfaces having both diffuse and regular components of reflection. The results presented in the article show that the calculation difference may reach 30 % when polarisation is taken into consideration as compared to standard modelling.

scholarly journals Anisotropic dielectric susceptibility matrix of anisotropic medium

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Wanrong Gao
Keyword(s):  
Light Scattering ◽  
Anisotropic Medium ◽  
Polarized Light ◽  
Scattering Matrix ◽  
Dielectric Susceptibility ◽  
Anisotropic Dielectric ◽  
New Methods ◽  
Mueller Matrices ◽  
Anisotropic Structures ◽  
The Fourier Transform

AbstractIn this work, we introduce the concept of anisotropic dielectric susceptibility matrix of anisotropic medium for both nondepolarizing and depolarizing medium. The concept provides a new way of analyzing light scattering properties of anisotropic media illuminated by polarized light. The explicit expressions for the elements of the scattering matrix are given in terms of the elements of the Fourier transform of the anisotropic dielectric susceptibility matrix of the medium. Finally, expressions for the elements of the Jones matrix of a thin layer of a deterministic anisotropic medium and the elements of the Mueller matrix of a depolarizing medium are given. The results obtained in this work is helpful for deriving information about the correlated anisotropic structures in depolarizing media from measured Mueller matrices. The findings in this work may also well prove stimulating to researchers working on new methods for analyzing light scattering properties.

scholarly journals Universal Synthesizer of Mueller Matrices Based on the Symmetry Properties of the Enpolarizing Ellipsoid

Symmetry ◽  
2021 ◽  
Vol 13 (6) ◽  
pp. 983
Author(s):  
José J. Gil ◽  
Ignacio San José
Keyword(s):  
Mathematical Structure ◽  
Mueller Matrix ◽  
Morphological Properties ◽  
Nondestructive Analysis ◽  
Structural Decomposition ◽  
Symmetry Properties ◽  
Mueller Matrices ◽  
Scattering Measurement ◽  
The Way

Polarimetry is today a widely used and powerful tool for nondestructive analysis of the structural and morphological properties of a great variety of material samples, including aerosols and hydrosols, among many others. For each given scattering measurement configuration, absolute Mueller polarimeters provide the most complete polarimetric information, intricately encoded in the 16 parameters of the corresponding Mueller matrix. Thus, the determination of the mathematical structure of the polarimetric information contained in a Mueller matrix constitutes a topic of great interest. In this work, besides a structural decomposition that makes explicit the role played by the diattenuation-polarizance of a general depolarizing medium, a universal synthesizer of Muller matrices is developed. This is based on the concept of an enpolarizing ellipsoid, whose symmetry features are directly linked to the way in which the polarimetric information is organized.

scholarly journals Optical Chirality Determined from Mueller Matrices

2021 ◽  
Vol 11 (15) ◽  
pp. 6742
Author(s):  
Hans Arwin ◽  
Stefan Schoeche ◽  
James Hilfiker ◽  
Mattias Hartveit ◽  
Kenneth Järrendahl ◽  
...  
Keyword(s):  
Circular Dichroism ◽  
Constitutive Relations ◽  
Mueller Matrix ◽  
Optical Path ◽  
Electromagnetic Modeling ◽  
Structural Effects ◽  
Polarization Effects ◽  
Optical Chirality ◽  
Mueller Matrices ◽  
Circular Dichroïsm

Optical chirality, in terms of circular birefringence and circular dichroism, is described by its electromagnetic and magnetoelectric material tensors, and the corresponding optical activity contributes to the Mueller matrix. Here, spectroscopic ellipsometry in the spectral range 210–1690 nm is used to address chiral phenomena by measuring Mueller matrices in transmission. Three approaches to determine chirality parameters are discussed. In the first approach, applicable in the absence of linear polarization effects, circular birefringence and circular dichroism are evaluated directly from elements of a Mueller matrix. In the second method, differential decomposition is employed, which allows for the unique separation of chirality parameters from linear anisotropic parameters as well as from depolarization provided that the sample is homogeneous along the optical path. Finally, electromagnetic modeling using the Tellegen constitutive relations is presented. The last method also allows structural effects to be included. The three methods to quantify optical chirality are demonstrated for selected materials, including sugar solutions, α-quartz, liquid crystals, beetle cuticle, and films of cellulose nanocrystals.

Analysis of experimental depolarizing Mueller matrices through a hybrid decomposition

2014 ◽  
Vol 54 (1) ◽  
pp. 27 ◽  
Author(s):  
Loïc Martin ◽  
Guy Le Brun ◽  
Bernard Le Jeune ◽  
Fabrice Pellen ◽  
Sylvain Rivet
Keyword(s):  
Mueller Matrices ◽  
Hybrid Decomposition

scholarly journals Imaging Mueller matrix ellipsometry setup for optical nanoform metrology

2020 ◽  
Vol 238 ◽  
pp. 06006
Author(s):  
Tim Käseberg ◽  
Jana Grundmann ◽  
Johannes Dickmann ◽  
Stefanie Kroker ◽  
Bernd Bodermann
Keyword(s):  
Finite Element Method ◽  
Finite Element ◽  
Numerical Simulations ◽  
Mueller Matrix ◽  
The Finite Element Method ◽  
Mueller Matrices ◽  
Microscope Images ◽  
Element Method

We designed, realized, and characterised an imaging Mueller matrix ellipsometry setup for the pixelwise measurement of the Mueller matrices in microscope images. Our setup is capable of performing measurements in reflection as well as in transmission in a broad range of angles of incidence for wavelengths between 400 nm and 700 nm. We compared measurements of specially designed nanostructured samples with AFM and SEM measurements as well as with numerical simulations using the finite element method.

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