A New Method of Frozen-fringe Holographic Interferometry Using Thermoplastic Recording Media

1978 ◽  
Vol 25 (8) ◽  
pp. 787-792 ◽  
Keyword(s):  
Holographic Interferometry ◽  
New Method ◽  
Recording Media

Annulling parasitic fringes in real time holographic interferometry: a new method

1991 ◽  
Vol 30 (13) ◽  
pp. 1588 ◽  
Author(s):  
Jesus Blanco-Garcia ◽  
Jose L. Fernandez ◽  
Carlos Lopez ◽  
Angel F. Doval ◽  
Mariano Perez-Amor
Keyword(s):  
Real Time ◽  
Holographic Interferometry ◽  
New Method

Microstructural characterization of CoPtCr/Cr thin film disks by cross-section TEM and elongated probe micro-diffraction

1991 ◽  
Vol 49 ◽  
pp. 762-763
Author(s):  
M.A. Parker ◽  
K.E. Johnson ◽  
C. Hwang ◽  
A. Bermea
Keyword(s):  
Magnetic Recording ◽  
Electron Probe ◽  
Microstructural Characterization ◽  
Crystallographic Structure ◽  
Recording Media ◽  
Layer By Layer ◽  
Cross Sectional ◽  
New Techniques ◽  
Polished Side

We have reported the dependence of the magnetic and recording properties of CoPtCr recording media on the thickness of the Cr underlayer. It was inferred from XRD data that grain-to-grain epitaxy of the Cr with the CoPtCr was responsible for the interaction observed between these layers. However, no cross-sectional TEM (XTEM) work was performed to confirm this inference. In this paper, we report the application of new techniques for preparing XTEM specimens from actual magnetic recording disks, and for layer-by-layer micro-diffraction with an electron probe elongated parallel to the surface of the deposited structure which elucidate the effect of the crystallographic structure of the Cr on that of the CoPtCr.XTEM specimens were prepared from magnetic recording disks by modifying a technique used to prepare semiconductor specimens. After 3mm disks were prepared per the standard XTEM procedure, these disks were then lapped using a tripod polishing device. A grid with a single 1mmx2mm hole was then glued with M-bond 610 to the polished side of the disk.

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